Abstract: A method and apparatus for terminating a probe that probes a semiconductor device with a signal cable from a tester is provided to connect layers of the probe to layers of the signal cable side by side. The probe and signal cable can be a co-axial or tri-axial probe and signal cable, respectively. A center conductive probe needle of the probe is disposed side by side with and electrically connects to a center signal conductor of the signal cable. A dielectric layer of the probe is disposed side by side with and connects to a dielectric layer of the signal cable. A conductive guard layer of the probe is disposed side by side with and electrically connects to a conductive dispersion/guard layer of the signal cable, and a sleeve of the probe is disposed side by side with and connects to a sleeve of the signal cable. In a tri-axial embodiment, a second dielectric layer of the probe is disposed side by side with and connects to a second dielectric layer of the signal cable.

Abstract: A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300° C.

Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.

Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.

Abstract: A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300 C.

Abstract: A probe apparatus for probing a device on a semiconductor wafer to be tested by a testing equipment is provided. The probe apparatus includes a replaceable probe tile removably mounted in a probing location on a base plate. The probe tile is configured into a self-contained assembly which includes a chassis body containing a plurality of probes for probing devices on a wafer, a dielectric block for supporting the probes, and a wireguide for guiding a plurality of cables from the testing equipment into the chassis body. A wafer station having replaceable base plates and replaceable probe tiles are also provided.

Abstract: A method and apparatus for terminating a probe that probes a semiconductor device with a signal cable from a tester is provided to connect layers of the probe to layers of the signal cable side by side. The probe and signal cable can be a co-axial or tri-axial probe and signal cable, respectively. A center conductive probe needle of the probe is disposed side by side with and electrically connects to a center signal conductor of the signal cable. A dielectric layer of the probe is disposed side by side with and connects to a dielectric layer of the signal cable. A conductive guard layer of the probe is disposed side by side with and electrically connects to a conductive dispersion/guard layer of the signal cable, and a sleeve of the probe is disposed side by side with and connects to a sleeve of the signal cable. In a tri-axial embodiment, a second dielectric layer of the probe is disposed side by side with and connects to a second dielectric layer of the signal cable.

Abstract: A panel connector system is provided and includes a plurality of panels and panel connectors. Each panel includes panel sidewall extensions, lips extending from the sidewall extensions, and cross-walls. The sidewall extensions, lips, and cross-walls define outwardly opening edge channels. The panel connectors include a base and a member extending generally transversely from the base. The base includes a base plate and a contact element. The arm portion includes a generally longitudinal slot, a ledge or protruding portion and a spring portion. A male seating surface extends from the ledge and a female seating surface is present on the spring portion. The clip base plate is fastened to the panel cross-wall and one of the lips is disposed in the clip slot when the clip is attached within the edge channel.

Abstract: A panel connector system is provided and includes a plurality of panels and panel connectors. Each panel includes panel sidewall extensions, lips extending from the sidewall extensions, and cross-walls. The sidewall extensions, lips, and cross-walls define outwardly opening edge channels. The panel connectors include a base and a member extending generally transversely from the base. The base includes a base plate and a contact element. The arm portion includes a generally longitudinal slot, a ledge or protruding portion and a spring portion. A male seating surface extends from the ledge and a female seating surface is present on the spring portion. The clip base plate is fastened to the panel cross-wall and one of the lips is disposed in the clip slot when the clip is attached within the edge channel.

Abstract: In a preferred embodiment, a portable display is formed of a plurality of assembleable panels, each of panels having a plurality of edge portions secured together with corner connectors to form a rectangular framework. Panelar sheet material extends over two side of the framework and polyurethane foam in injected into the interior space. Panel connector portions, either of the sliding type, or the peg or plug-in type secure the panels together to form the display. In a preferred embodiment, each panel has four corners each with corner components that engage with the edge portions, preferably by insertion into receiving openings in said edge portions. Said corner components having a receptacle exposed at each corner to permit either connection with plug-in components, for example, panel connectors for vertical stacking of panels or accessory brackets.

Abstract: A portable display formed of a plurality of assembleable panels having wire management permitting concealment of wire for powering accessories within the junctures between panels. In a preferred embodiment, the panel edges have edge portions formed with outwardly facing channels defining or including wire conduits. Panel connector portions, either of the sliding type, or the peg or plug-in type secure the panels together to form the display. In a preferred embodiment, each panel has four corners each with corner components that engage with the edge portions, preferably by insertion into receiving openings in said edge portions. Said corner components having a receptacle exposed at each corner to permit either connection with plug-in components, for example, panel connectors for vertical stacking of panels or with accessory brackets.