Patents by Inventor William H. Brodhead

William H. Brodhead has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Packaged semiconductor device with test circuits for determining fabrication parameters
    Patent number: 4970454
    Abstract: A test circuit (40) fabricated in an integrated circuit and connected to an I/O pin (36) of the packaged device (32) for providing information indicative of substrate process parameters. The test circuit (40) comprises a test transistor (24) connected to a pin (36) of the packaged device (32), and an isolation circuit (52) responsive to a signal on an input test terminal (48) for activating the test transistor (24). The isolation circuit (52) is responsive to the absence of the test signal for isolating the test transistor (24) from the pin (36), and thus isolating it from other functional circuitry (54) of the integrated circuit which is also connected to the pin (36).
    Type: Grant
    Filed: March 15, 1990
    Date of Patent: November 13, 1990
    Assignee: Texas Instruments Incorporated
    Inventors: Mark A. Stambaugh, William H. Brodhead