Abstract: In the design of stud and conducting line joints, the conducting line is extended beyond the stud without any significant overhang of the line in the width direction for minimizing induced stress in order to reduce voids and crack growth in the region where the connecting line is joined to the stud. The preferred length of the extension is in the range approximately between one-quarter and twice the stud dimension. The design is applicable, but not limited to, multilevel integrated circuits used in computers and other electrical devices.

Abstract: A system for controlling the flow of semiconductor products and their components through a production facility including assembly and final testing of a large number of different products with multiple product grades. The system stores information on the demand and inventory of all product grades together with grade distribution data giving the yield of all co-products of a product family from testing the common component of that family. The system includes means for calculating the number of common components to be tested to cover the requirements for all co-products of a family. The distribution data also gives the yield of all by-products of a test for particular products, and the system operates to adjust the inventory status for other products corresponding to such by-products, to avoid excess production of such other products in meeting projected demand.

Abstract: A method and apparatus for increasing the growth of plants (24) in a greenhouse (12, 13) or other protected area is described. The method and apparatus regulates the amount of carbon dioxide to which the plants are exposed and the temperature of the atmosphere as a function of the amount of light in a pre-selected temperature range and vents the greenhouse to outside air above the temperature range. The method preferably uses a computer (10) and microprocessor (11) for detection, analysis and adjustment of the growth variables.