Patents by Inventor William H. Pember

William H. Pember has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Specially designed phased array transducer for the inspection of fastener holes and adjacent structure without the removal of the fastener
    Patent number: 9945817
    Abstract: A phased array transducer for inspecting a fastener hole and adjacent structure to identify defects and determine hole integrity without removing the fastener from the hole. The phased array transducer includes a plurality of transducer elements, where one of the transducer elements is used to align the transducer to the hole, one group of the remaining transducer elements inspects the entire thickness of the structure at one side of the fastener and another group of the remaining transducer elements inspects the entire thickness of the structure at an opposite side of the fastener.
    Type: Grant
    Filed: August 4, 2015
    Date of Patent: April 17, 2018
    Assignee: Northrop Grumman Systems Corporation
    Inventors: William H. Pember, Kevin L. Boyd, Kevin H. Cook, Chris Famighetti, Robert D. Fidnarick, John Munyak, John D. Weir
  • SPECIALLY DESIGNED PHASED ARRAY TRANSDUCER FOR THE INSPECTION OF FASTENER HOLES AND ADJACENT STRUCTURE WITHOUT THE REMOVAL OF THE FASTENER
    Publication number: 20170038341
    Abstract: A phased array transducer for inspecting a fastener hole and adjacent structure to identify defects and determine hole integrity without removing the fastener from the hole. The phased array transducer includes a plurality of transducer elements, where one of the transducer elements is used to align the transducer to the hole, one group of the remaining transducer elements inspects the entire thickness of the structure at one side of the fastener and another group of the remaining transducer elements inspects the entire thickness of the structure at an opposite side of the fastener.
    Type: Application
    Filed: August 4, 2015
    Publication date: February 9, 2017
    Inventors: WILLIAM H. PEMBER, KEVIN L. BOYD, KEVIN H. COOK, CHRIS FAMIGHETTI, ROBERT D. FIDNARICK, JOHN MUNYAK, JOHN D. WEIR
  • Electromagnetic test for microstructure anomalies such as alpha-case, and for carbide precipitates and untempered and overtempered martensite
    Patent number: 5811970
    Abstract: An electromagnetic or eddy-current test for microstructure anomalies such as alpha-case in titanium alloys, and for carbide precipitates and untempered and overtempered martensite in steel alloys. The inspection is designed to provide an accurate, reproducible, cost effective, and nondestructive approach to detect and isolate discrepant parts exhibiting an unsatisfactory microstructural condition. The test method utilizes high frequency eddy-current test equipment, having an eddy-current test probe and a display screen, on a reference metallurgical standard to establish a reference level trace signal of phase amplitude response therefor on the display screen. The high frequency eddy-current test equipment is then utilized on a metallurgical sample being tested for the presence of the deleterious structural condition, to derive a trace signal of phase amplitude response therefor on the display screen.
    Type: Grant
    Filed: May 10, 1996
    Date of Patent: September 22, 1998
    Assignee: Northrop Grumman Corporation
    Inventors: Kevin H. Cook, John J. Munyak, William H. Pember