Abstract: Embodiment of this disclosure provides a mechanism to support hang detection and data recovery in microprocessor systems. In one embodiment, a processing device comprising a processing core and a crashlog unit operatively coupled to the core is provided. An indication of an unresponsive state in an execution of a pending instruction by the core is received. Responsive to receiving the indication, a crash log comprising data from registers of at least one of: a core region, a non-core region and a controller hub associated with the processing device is produced. Thereupon, the crash log is stored in a shared memory of a power management controller (PMC) associated with the controller hub.

Abstract: Embodiment of this disclosure provides a mechanism to support hang detection and data recovery in microprocessor systems. In one embodiment, a processing device comprising a processing core and a crashlog unit operatively coupled to the core is provided. An indication of an unresponsive state in an execution of a pending instruction by the core is received. Responsive to receiving the indication, a crash log comprising data from registers of at least one of: a core region, a non-core region and a controller hub associated with the processing device is produced. Thereupon, the crash log is stored in a shared memory of a power management controller (PMC) associated with the controller hub.

Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test.

Abstract: A method and apparatus for collecting debug and crash information are described. In one embodiment, a system comprises one or more compute engines an external interface; a non-volatile memory coupled to the external interface and operable to store captured information, wherein the captured information comprises one or both of debug information and crash information; a first trace aggregator coupled to the non-volatile memory and the one or more compute engines to capture the one or both of debug information and crash information from at least one of the one or more compute engines in response to a crash of the system; and a controller, coupled to the non-volatile memory and the first trace aggregator, to cause captured information to be sent from the first trace aggregator to the non-volatile memory and to subsequently control transfer of the captured information stored in the non-volatile memory to the external interface.

Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test.