Patents by Inventor William J. Baukus

William J. Baukus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods to perform backscatter inspection of complex targets in confined spaces
    Patent number: 8923481
    Abstract: Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: December 30, 2014
    Assignee: American Science and Engineering, Inc.
    Inventors: Jeffrey R. Schubert, John P. Handy, Richard L. Schueller, Terry Lee McElroy, David C. Walazek, William J. Baukus
  • Methods to Perform Backscatter Inspection of Complex Targets in Confined Spaces
    Publication number: 20130101090
    Abstract: Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.
    Type: Application
    Filed: April 13, 2012
    Publication date: April 25, 2013
    Applicant: AMERICAN SCIENCE AND ENGINEERING, INC.
    Inventors: Jeffrey R. Schubert, John P. Handy, Richard L. Schueller, David C. Walazek, William J. Baukus
  • X-ray inspection based on scatter detection
    Patent number: 7551715
    Abstract: Systems and methods for inspecting an object with a scanned beam of penetrating radiation are disclosed. Scattered radiation from the beam is detected, in either the backward or forward direction. Characteristic values of the backscattered radiation are compared to expected reference values to characterize the object. Additionally, penetrating radiation transmitted through the inspected object may be combined with scatter information. In certain embodiments, the inspected field of view is less than 0.1 steradians, and the detector is separate from the source of penetrating radiation and is disposed, with respect to the object, such as to subtend greater than 0.5 steradians in the field of view of the object.
    Type: Grant
    Filed: October 23, 2006
    Date of Patent: June 23, 2009
    Assignee: American Science and Engineering, Inc.
    Inventors: Peter Rothschild, Jeffrey Schubert, William J. Baukus, William Wade Sapp, Jr., Richard Schueller, Joseph Callerame, William Randall Cason