Patents by Inventor William J. Haydamack

William J. Haydamack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4016492
    Abstract: The logic circuit tester probe system described herein incorporates noise filter and data discrimination capability by comparing the duration of pulses received with the duration of the output of a one-shot. The probe system also incorporates misprobe detection capability which alerts the user that his probe is not making electrical contact with the circuit node under test whenever the input of the probe assumes the magnitude of a reference voltage rather than the magnitude of the voltage at the circuit node.
    Type: Grant
    Filed: June 9, 1975
    Date of Patent: April 5, 1977
    Assignee: Hewlett-Packard Company
    Inventors: Edward C. Miller, Jr., William J. Haydamack