Abstract: A decoder circuit in a memory system accepts as inputs a clock signal and a plurality of address lines and produces as outputs a plurality of decode lines, such as word lines. The decoder circuit comprises a plurality of pre-decoding circuits, a plurality of latches, and a plurality of AND gates. Each pre-decoding circuit is connected to the clock signal and a unique combination of a subset of the plurality of address lines and their complements. Each pre-decoding circuit produces an output that is set in response to a unique state of the respective subset of the plurality of address lines. Each latch input is connected to an output of a respective one of the plurality of pre-decoding circuits. Each latch output is connected to an AND gate input, and each AND gate output is one of the plurality of decode lines. In another sense, the decoder comprises one or more stages of decoding logic and a set of latches. A first stage of decoding logic accepts the decoder inputs.

Abstract: A dynamic logic circuit having additional test circuitry and control, enabling the dynamic logic gate to operate normally during testing or alternatively to force the dynamic logic gate output to a known state during testing to provide a known input for downstream logic. With the additional test circuitry, there is no need for input test signal sequences to propagate logical test vectors to tested nodes. The dynamic logic circuit includes a storage node that is precharged during a precharge cycle and logic circuitry that may discharge the storage node during an evaluation cycle, depending on logic inputs. The logic circuitry discharges through a clock transistor. Additional test circuitry is added to discharge the storage node during the evaluation cycle, in response to a test control signal and a test state signal. When the dynamic logic gate is operating normally during testing, the test circuitry is disabled.

Abstract: A shift register, circular pointer or ring counter presents a reduced capacitive load on the clock and shift signals used to control it. The device is constructed using one or more enhanced data cells. Each data cell has a data input, a data output, a clock input and a shift input. The data output of each cell is coupled to the data input of an adjacent cell. At least one pass-AND gate is provided for each cell. The pass-AND gate has a switching input and a switched input. The switching input operates to toggle the input capacitance of the switched input between a larger and a smaller value. The logical OR of the data input and data output of each cell is used to drive the switching input of the associated pass-AND gates for that cell. The switched input of the pass-AND gate is adapted to be coupled to the clock (or shift) signal, and the output of the pass-AND gate is coupled to the clock (or shift) input of the data cell.