Patents by Inventor William J. Williams

William J. Williams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240142368
    Abstract: A method, system and apparatus for selecting cells is disclosed. An example embodiment provides spatial information denoting the location, on a four part array of sensors, referred to as a quad array, of the center, of each particle that passes through the focused laser beam in a cell sorter. The center of a particle is commonly determined by the average fluorescence intensity within the field of view of a Side Fluorescence (SFL) collection lens. Fluorescence collected by an SFL lens from a particle having any orientation and any position in the core stream produces a spot large enough to illuminate all four segments of a quad array. By independently measuring the fluorescence intensity recorded by each of the four array segments for a particle, it is possible to calculate the x-y coordinate position across the quad array segments of the average total fluorescence emission collected from that particle.
    Type: Application
    Filed: October 27, 2023
    Publication date: May 2, 2024
    Inventors: Gary Durack, William J. Williams, V
  • Publication number: 20240042491
    Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.
    Type: Application
    Filed: October 20, 2023
    Publication date: February 8, 2024
    Inventors: Gary Durack, William J. Williams, V
  • Patent number: 11858008
    Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: January 2, 2024
    Assignee: CYTONOME/ST, LLC
    Inventors: Gary Durack, William J. Williams, V
  • Publication number: 20220305529
    Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.
    Type: Application
    Filed: March 28, 2022
    Publication date: September 29, 2022
    Inventors: Gary Durack, William J. Williams, V
  • Patent number: 7022993
    Abstract: Leak detector using infrared for identifying the presence and concentration of a selected gas. For detection, radiation from an infrared emitter penetrates the sample, which is analyzed spectrally, and results in a wave length-specific signal being generated at the output. By controlling the optical filter, the radiation is controlled at a selected wavelength, to ensure coverage of all selected compounds. For refrigerants, the selected wavelength can be between approximately 8 to approximately 10 microns. This wavelength obscures other signals, thus minimizing false alarms. The leak detector has a faster time with no adverse impacts on the accuracy of the compound being detected. To further minimize false alarms and to ensure that the emitter does not come in contact with the gas, an additional filter can be used. For refrigerant compounds, the filter can block out signals below approximately 6 microns. For detecting refrigerants, two filters can be used.
    Type: Grant
    Filed: July 26, 2004
    Date of Patent: April 4, 2006
    Assignee: Twin Rivers Engineering, Inc.
    Inventors: William J. Williams, II, Glenn A. Dejong
  • Patent number: 6989184
    Abstract: An extruded polymeric void-board is configured for placement between adjacent horizontal layers of bricks to maintain an opening in a lower layer of the bricks. The void-board is formed as a relatively thin planar element having first and second surfaces. A plurality of parallel ribs extend from and generally transverse to the first side. The ribs have a predetermined height to width ratio and have a height that is less than a thickness of the planar element. The ribs being formed parallel to one another. A method for forming a bundle of bricks with the void-board is also disclosed.
    Type: Grant
    Filed: March 18, 2004
    Date of Patent: January 24, 2006
    Assignee: Illinois Tool Works, Inc.
    Inventors: David J. Duke, William J. Williams, John M. Kruelle, Tilak R. Varma
  • Patent number: 6936985
    Abstract: A sensing device includes a piezoelectric vibration sensor mounted to a surface for producing an analog signal proportional to raindrops striking the surface, an amplifier, an analog-to-digital converter, and a processor for calculating the rain rate based on an exponential probability density function of a first order point process.
    Type: Grant
    Filed: July 21, 2003
    Date of Patent: August 30, 2005
    Assignee: AGC America, Inc.
    Inventors: Brent W. Pankey, Colin John Byrne, Mark S. Ackerman, Mitchell M. Rohde, William J. Williams
  • Patent number: 6892580
    Abstract: A method for determining a rate of rain falling on a surface. As rain falls and strikes the surface, vibrations are generated on the surface. The vibrations are sensed and a vibration signal is generated, the vibration signal being proportional to the vibrations of the surface. The vibration signal includes peaks. The peaks of the vibration signal are determined. The time intervals between the peaks are then determined. Using the time intervals, a number n1 of timer intervals that occur between a first time and a second time are counted. A number n2 of time intervals that occur between the second time and a third time are also counted. The rain rate ? is then determined using an equation that is derived from a point process equation and utilizes n1 and n2.
    Type: Grant
    Filed: July 21, 2003
    Date of Patent: May 17, 2005
    Assignee: AGC America, Inc.
    Inventors: Brent W. Pankey, Colin John Byrne, Mark S. Ackerman, Mitchell M. Rohde, William J. Williams
  • Patent number: 6791088
    Abstract: A leak detector using an infrared emitter and pyroelectric sensor to form an instrument for identifying the presence and concentration of a selected material type gas compound, such as a refrigerant gas compound within a given sample, such as a sample of ambient air. For the detection, a radiation flux coming from an infrared emitter penetrates the sample, which is analyzed spectrally, and results in a wave length-specific signal being generated at the output of the detector. By controlling the type of optical filter, the radiation energy is controlled at a selected wavelength, to ensure coverage of all selected compounds. For refrigerants, the selected wavelength can be between approximately 8 to approximately 10 microns in the wavelength range. This selected wavelength obscures other signals, thus minimizing false alarms. By not chopping or pulsing the emitter, the leak detector has a faster response time with no adverse impacts on the accuracy of the compound material being detected.
    Type: Grant
    Filed: May 3, 2002
    Date of Patent: September 14, 2004
    Assignee: Twin Rivers Engineering, Inc.
    Inventors: William J. Williams, II, Glenn A. Dejong
  • Patent number: 6178261
    Abstract: Method and system for extracting features from measurement signals obtained from real world, physical signals by first forming an invariant component of the measurement signals and then using a technique based on a noise subspace algorithm. This technique first casts or projects the transformed measurement signals into separate subspaces for each extraneous variation or group of variations. The subspaces have minimal over-lap. The recognition of a particular invariant component within a pertinent subspace is then preferably performed using Singular Value Decomposition (SVD) techniques to generate a pattern recognition signal. A series of transformations can be used to form an invariant component called the Scale and Translation Invariant Representation (STIR).
    Type: Grant
    Filed: August 5, 1997
    Date of Patent: January 23, 2001
    Assignee: The Regents of the University of Michigan
    Inventors: William J. Williams, Eugene J. Zalubas, Robert M. Nickel, Alfred O. Hero, III, Jeffrey C. O'Neill
  • Patent number: 5444435
    Abstract: There is disclosed apparatus for monitoring the concentration levels of halogen gas in a gaseous atmosphere as confined in an enclosure over a relatively extended period of time. Such monitoring apparatus includes a sensor including first and second electrodes disposed to define a space therebetween through which the gaseous atmosphere flows and a voltage source for applying a voltage between the first and second electrodes whereby an ionization current flows to the first electrode. A control mechanism illustratively in the form of a programmed microcontroller monitors the ionization current collected by the first electrode as the output signal of the sensor, to determine an increase therein as would be indicative of a halogen leak. Upon determining an increase of the sensor output signal above a predetermined difference, the control mechanism removes the energization from the halogen sensor whereby the ionization current is terminated and the life of the sensor extended.
    Type: Grant
    Filed: March 29, 1993
    Date of Patent: August 22, 1995
    Inventors: William J. Williams, II, Daniel M. Thorsen
  • Patent number: 5412589
    Abstract: A system including method and apparatus for determining the energy content in a signal to be analyzed employs, in an apparatus aspect thereof, a sampling element for producing samples of the electrical signal to be analyzed, a local correlator for producing a plurality of signals corresponding to the samples delayed and multiplicatively combined with their complex conjugates, a bank of delay and adder systems for correlating the outputs of the multipliers in accordance with a binomial kernel, and a Fourier transformer for producing the distribution as a function of time and frequency. Local correlation is effected using a multi-element delay system, such as a shift register. Binomial correlation in the delay and adder systems is achieved by combining additively given samples with samples which are in other states of delay. Moreover, the banks have respectively different numbers of such delay and adder systems. The resulting analytic signal corresponds to a binomial kernel.
    Type: Grant
    Filed: June 16, 1992
    Date of Patent: May 2, 1995
    Assignee: University of Michigan
    Inventors: William J. Williams, Jechang Jeong
  • Patent number: 5331840
    Abstract: A method for discovering amounts of halogen in a liquid is provided wherein the a reservoir comprising the liquid and suspected halogen is healed to a temperature characteristic of the solubility of halogen in the liquid to provide a vapor. After condensing, a sampling vapor is provided to from which the amount of halogen may be detected.
    Type: Grant
    Filed: May 21, 1992
    Date of Patent: July 26, 1994
    Assignee: Sentech Corporation
    Inventor: William J. Williams
  • Patent number: 5198774
    Abstract: There is disclosed apparatus for monitoring the concentration levels of halogen gas in a gaseous atmosphere as confined in an enclosure over a relatively extended period of time. Such monitoring apparatus includes a sensor including first and second electrodes disposed to define a space therebetween through which the gaseous atmosphere flows and a voltage source for applying a voltage between the first and second electrodes whereby an ionization current flows to the first electrode. A control mechanism illustratively in the form of a programmed microcontroller monitors the ionization current collected by the first electrode as the output signal of the sensor, to determine an increase therein as would be indicative of a halogen leak. Upon determining an increase of the sensor output signal above a predetermined difference, the control mechanism removes the energization from the halogen sensor whereby the ionization current is terminated and the life of the sensor extended.
    Type: Grant
    Filed: March 19, 1990
    Date of Patent: March 30, 1993
    Inventors: William J. Williams, II, Daniel M. Thorsen
  • Patent number: 5115666
    Abstract: A method for discovering amounts of halogen in a liquid is provided wherein a reservoir comprising the liquid and suspected halogen is heated to a temperature characteristic of the solubility of halogen in the liquid to provide a vapor. After condensing, a sampling vapor is provided from which the amount of halogen may be detected.
    Type: Grant
    Filed: February 8, 1990
    Date of Patent: May 26, 1992
    Assignee: Sentech Corporation
    Inventor: William J. Williams
  • Patent number: D689381
    Type: Grant
    Filed: May 17, 2012
    Date of Patent: September 10, 2013
    Assignee: PAR Technology Corporation
    Inventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams, Scott Langdoc
  • Patent number: D689921
    Type: Grant
    Filed: August 16, 2012
    Date of Patent: September 17, 2013
    Assignee: Par Technology Corporation
    Inventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams
  • Patent number: D706863
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: June 10, 2014
    Assignee: Par Technology Corporation
    Inventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams
  • Patent number: D706864
    Type: Grant
    Filed: August 8, 2012
    Date of Patent: June 10, 2014
    Assignee: PAR Technology Corporation
    Inventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams
  • Patent number: D707288
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: June 17, 2014
    Assignee: PAR Technology Corporation
    Inventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams