Patents by Inventor William J. Williams
William J. Williams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240142368Abstract: A method, system and apparatus for selecting cells is disclosed. An example embodiment provides spatial information denoting the location, on a four part array of sensors, referred to as a quad array, of the center, of each particle that passes through the focused laser beam in a cell sorter. The center of a particle is commonly determined by the average fluorescence intensity within the field of view of a Side Fluorescence (SFL) collection lens. Fluorescence collected by an SFL lens from a particle having any orientation and any position in the core stream produces a spot large enough to illuminate all four segments of a quad array. By independently measuring the fluorescence intensity recorded by each of the four array segments for a particle, it is possible to calculate the x-y coordinate position across the quad array segments of the average total fluorescence emission collected from that particle.Type: ApplicationFiled: October 27, 2023Publication date: May 2, 2024Inventors: Gary Durack, William J. Williams, V
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Publication number: 20240042491Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.Type: ApplicationFiled: October 20, 2023Publication date: February 8, 2024Inventors: Gary Durack, William J. Williams, V
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Patent number: 11858008Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.Type: GrantFiled: March 28, 2022Date of Patent: January 2, 2024Assignee: CYTONOME/ST, LLCInventors: Gary Durack, William J. Williams, V
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Publication number: 20220305529Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.Type: ApplicationFiled: March 28, 2022Publication date: September 29, 2022Inventors: Gary Durack, William J. Williams, V
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Patent number: 7022993Abstract: Leak detector using infrared for identifying the presence and concentration of a selected gas. For detection, radiation from an infrared emitter penetrates the sample, which is analyzed spectrally, and results in a wave length-specific signal being generated at the output. By controlling the optical filter, the radiation is controlled at a selected wavelength, to ensure coverage of all selected compounds. For refrigerants, the selected wavelength can be between approximately 8 to approximately 10 microns. This wavelength obscures other signals, thus minimizing false alarms. The leak detector has a faster time with no adverse impacts on the accuracy of the compound being detected. To further minimize false alarms and to ensure that the emitter does not come in contact with the gas, an additional filter can be used. For refrigerant compounds, the filter can block out signals below approximately 6 microns. For detecting refrigerants, two filters can be used.Type: GrantFiled: July 26, 2004Date of Patent: April 4, 2006Assignee: Twin Rivers Engineering, Inc.Inventors: William J. Williams, II, Glenn A. Dejong
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Patent number: 6989184Abstract: An extruded polymeric void-board is configured for placement between adjacent horizontal layers of bricks to maintain an opening in a lower layer of the bricks. The void-board is formed as a relatively thin planar element having first and second surfaces. A plurality of parallel ribs extend from and generally transverse to the first side. The ribs have a predetermined height to width ratio and have a height that is less than a thickness of the planar element. The ribs being formed parallel to one another. A method for forming a bundle of bricks with the void-board is also disclosed.Type: GrantFiled: March 18, 2004Date of Patent: January 24, 2006Assignee: Illinois Tool Works, Inc.Inventors: David J. Duke, William J. Williams, John M. Kruelle, Tilak R. Varma
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Patent number: 6936985Abstract: A sensing device includes a piezoelectric vibration sensor mounted to a surface for producing an analog signal proportional to raindrops striking the surface, an amplifier, an analog-to-digital converter, and a processor for calculating the rain rate based on an exponential probability density function of a first order point process.Type: GrantFiled: July 21, 2003Date of Patent: August 30, 2005Assignee: AGC America, Inc.Inventors: Brent W. Pankey, Colin John Byrne, Mark S. Ackerman, Mitchell M. Rohde, William J. Williams
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Patent number: 6892580Abstract: A method for determining a rate of rain falling on a surface. As rain falls and strikes the surface, vibrations are generated on the surface. The vibrations are sensed and a vibration signal is generated, the vibration signal being proportional to the vibrations of the surface. The vibration signal includes peaks. The peaks of the vibration signal are determined. The time intervals between the peaks are then determined. Using the time intervals, a number n1 of timer intervals that occur between a first time and a second time are counted. A number n2 of time intervals that occur between the second time and a third time are also counted. The rain rate ? is then determined using an equation that is derived from a point process equation and utilizes n1 and n2.Type: GrantFiled: July 21, 2003Date of Patent: May 17, 2005Assignee: AGC America, Inc.Inventors: Brent W. Pankey, Colin John Byrne, Mark S. Ackerman, Mitchell M. Rohde, William J. Williams
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Patent number: 6791088Abstract: A leak detector using an infrared emitter and pyroelectric sensor to form an instrument for identifying the presence and concentration of a selected material type gas compound, such as a refrigerant gas compound within a given sample, such as a sample of ambient air. For the detection, a radiation flux coming from an infrared emitter penetrates the sample, which is analyzed spectrally, and results in a wave length-specific signal being generated at the output of the detector. By controlling the type of optical filter, the radiation energy is controlled at a selected wavelength, to ensure coverage of all selected compounds. For refrigerants, the selected wavelength can be between approximately 8 to approximately 10 microns in the wavelength range. This selected wavelength obscures other signals, thus minimizing false alarms. By not chopping or pulsing the emitter, the leak detector has a faster response time with no adverse impacts on the accuracy of the compound material being detected.Type: GrantFiled: May 3, 2002Date of Patent: September 14, 2004Assignee: Twin Rivers Engineering, Inc.Inventors: William J. Williams, II, Glenn A. Dejong
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Patent number: 6178261Abstract: Method and system for extracting features from measurement signals obtained from real world, physical signals by first forming an invariant component of the measurement signals and then using a technique based on a noise subspace algorithm. This technique first casts or projects the transformed measurement signals into separate subspaces for each extraneous variation or group of variations. The subspaces have minimal over-lap. The recognition of a particular invariant component within a pertinent subspace is then preferably performed using Singular Value Decomposition (SVD) techniques to generate a pattern recognition signal. A series of transformations can be used to form an invariant component called the Scale and Translation Invariant Representation (STIR).Type: GrantFiled: August 5, 1997Date of Patent: January 23, 2001Assignee: The Regents of the University of MichiganInventors: William J. Williams, Eugene J. Zalubas, Robert M. Nickel, Alfred O. Hero, III, Jeffrey C. O'Neill
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Patent number: 5444435Abstract: There is disclosed apparatus for monitoring the concentration levels of halogen gas in a gaseous atmosphere as confined in an enclosure over a relatively extended period of time. Such monitoring apparatus includes a sensor including first and second electrodes disposed to define a space therebetween through which the gaseous atmosphere flows and a voltage source for applying a voltage between the first and second electrodes whereby an ionization current flows to the first electrode. A control mechanism illustratively in the form of a programmed microcontroller monitors the ionization current collected by the first electrode as the output signal of the sensor, to determine an increase therein as would be indicative of a halogen leak. Upon determining an increase of the sensor output signal above a predetermined difference, the control mechanism removes the energization from the halogen sensor whereby the ionization current is terminated and the life of the sensor extended.Type: GrantFiled: March 29, 1993Date of Patent: August 22, 1995Inventors: William J. Williams, II, Daniel M. Thorsen
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Patent number: 5412589Abstract: A system including method and apparatus for determining the energy content in a signal to be analyzed employs, in an apparatus aspect thereof, a sampling element for producing samples of the electrical signal to be analyzed, a local correlator for producing a plurality of signals corresponding to the samples delayed and multiplicatively combined with their complex conjugates, a bank of delay and adder systems for correlating the outputs of the multipliers in accordance with a binomial kernel, and a Fourier transformer for producing the distribution as a function of time and frequency. Local correlation is effected using a multi-element delay system, such as a shift register. Binomial correlation in the delay and adder systems is achieved by combining additively given samples with samples which are in other states of delay. Moreover, the banks have respectively different numbers of such delay and adder systems. The resulting analytic signal corresponds to a binomial kernel.Type: GrantFiled: June 16, 1992Date of Patent: May 2, 1995Assignee: University of MichiganInventors: William J. Williams, Jechang Jeong
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Patent number: 5331840Abstract: A method for discovering amounts of halogen in a liquid is provided wherein the a reservoir comprising the liquid and suspected halogen is healed to a temperature characteristic of the solubility of halogen in the liquid to provide a vapor. After condensing, a sampling vapor is provided to from which the amount of halogen may be detected.Type: GrantFiled: May 21, 1992Date of Patent: July 26, 1994Assignee: Sentech CorporationInventor: William J. Williams
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Patent number: 5198774Abstract: There is disclosed apparatus for monitoring the concentration levels of halogen gas in a gaseous atmosphere as confined in an enclosure over a relatively extended period of time. Such monitoring apparatus includes a sensor including first and second electrodes disposed to define a space therebetween through which the gaseous atmosphere flows and a voltage source for applying a voltage between the first and second electrodes whereby an ionization current flows to the first electrode. A control mechanism illustratively in the form of a programmed microcontroller monitors the ionization current collected by the first electrode as the output signal of the sensor, to determine an increase therein as would be indicative of a halogen leak. Upon determining an increase of the sensor output signal above a predetermined difference, the control mechanism removes the energization from the halogen sensor whereby the ionization current is terminated and the life of the sensor extended.Type: GrantFiled: March 19, 1990Date of Patent: March 30, 1993Inventors: William J. Williams, II, Daniel M. Thorsen
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Patent number: 5115666Abstract: A method for discovering amounts of halogen in a liquid is provided wherein a reservoir comprising the liquid and suspected halogen is heated to a temperature characteristic of the solubility of halogen in the liquid to provide a vapor. After condensing, a sampling vapor is provided from which the amount of halogen may be detected.Type: GrantFiled: February 8, 1990Date of Patent: May 26, 1992Assignee: Sentech CorporationInventor: William J. Williams
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Patent number: D689381Type: GrantFiled: May 17, 2012Date of Patent: September 10, 2013Assignee: PAR Technology CorporationInventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams, Scott Langdoc
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Patent number: D689921Type: GrantFiled: August 16, 2012Date of Patent: September 17, 2013Assignee: Par Technology CorporationInventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams
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Patent number: D706863Type: GrantFiled: August 7, 2012Date of Patent: June 10, 2014Assignee: Par Technology CorporationInventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams
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Patent number: D706864Type: GrantFiled: August 8, 2012Date of Patent: June 10, 2014Assignee: PAR Technology CorporationInventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams
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Patent number: D707288Type: GrantFiled: August 6, 2012Date of Patent: June 17, 2014Assignee: PAR Technology CorporationInventors: James David Branck, Bernard Wesley Baker, Jr., Brian D. Johnson, William J. Williams