Patents by Inventor William J. Williams, V

William J. Williams, V has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240142368
    Abstract: A method, system and apparatus for selecting cells is disclosed. An example embodiment provides spatial information denoting the location, on a four part array of sensors, referred to as a quad array, of the center, of each particle that passes through the focused laser beam in a cell sorter. The center of a particle is commonly determined by the average fluorescence intensity within the field of view of a Side Fluorescence (SFL) collection lens. Fluorescence collected by an SFL lens from a particle having any orientation and any position in the core stream produces a spot large enough to illuminate all four segments of a quad array. By independently measuring the fluorescence intensity recorded by each of the four array segments for a particle, it is possible to calculate the x-y coordinate position across the quad array segments of the average total fluorescence emission collected from that particle.
    Type: Application
    Filed: October 27, 2023
    Publication date: May 2, 2024
    Inventors: Gary Durack, William J. Williams, V
  • Publication number: 20240042491
    Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.
    Type: Application
    Filed: October 20, 2023
    Publication date: February 8, 2024
    Inventors: Gary Durack, William J. Williams, V
  • Patent number: 11858008
    Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: January 2, 2024
    Assignee: CYTONOME/ST, LLC
    Inventors: Gary Durack, William J. Williams, V
  • Publication number: 20220305529
    Abstract: Systems and methods for particle sorting are presented including a monitoring system downstream of a particle separator or sorter. The system can utilize the monitoring system to adjust or calibrate operational parameters of the system in real time. When a particle of interest is mis-sorted, the probability is high that the particle of interest has been sorted into a non-targeted sortable unit that was adjacent in sequence to the sortable unit that was expected to include the particle of interest. The monitoring system monitors non-targeted sortable units in the system that were adjacent in sequence to targeted sortable units that are predicted to contain particles of interest. Signals from the monitoring system enable automated adjustment or calibration of operational parameters of the system such as sort delay or purity mask parameters.
    Type: Application
    Filed: March 28, 2022
    Publication date: September 29, 2022
    Inventors: Gary Durack, William J. Williams, V