Abstract: An additive manufacturing apparatus can include a stage configured to hold one or more cured layers of resin that form a component. A radiant energy device can be operable to generate and project radiant energy in a patterned image. An actuator can be configured to change a relative position of the stage relative to the radiant energy device. A reclamation system can be downstream of the stage and can be configured to remove at least a portion of the resin from a resin support. The reclamation system can include a first collection structure configured to accept a resin support therethrough along a resin support movement direction. A first scraper is positioned within the first collection structure. The first scraper has an elongation axis that is offset from the resin support movement direction by an offset angle that is less than 90 degrees.

Abstract: An additive manufacturing apparatus can include a stage configured to hold a component formed by one or more layers of resin. A support plate can be positioned above the stage. A radiant energy device can be positioned above the stage. The radiant energy device can be operable to generate and project energy in a predetermined pattern. A feed module can be configured to operably couple with a first end portion of a resin support and can be positioned upstream of the stage. A take-up module can be configured to operably couple with a second end portion of the resin support and can be positioned downstream of the stage.

Abstract: A method includes determining, using a processing device, a set of observations from coolant data, the coolant data being received from one or more sensors in an environment associated with a coolant. The method further includes determining, using a machine learning model and the set of observations, a contamination level of the coolant. The method also includes initiating an operation, using the processing device, responsive to determining the coolant contamination level.

Abstract: A test system for testing a communication system having a plurality of communication links is disclosed. The test system has a single tester for performing various measurement and diagnostic tasks on a single link. The test system also has a switching system for independently testing any link by coupling the tester into any one link. The tester is coupled into the link by coupling the tester input to the link's transmitter and the tester output to the link's receiver. The switching system couples the tester such that all remaining links of the communication system have a unique one of the plurality of transmitters coupled to a unique one of the plurality of receivers, whereby the operation of the communication system can be maintained while testing individual links.

Abstract: A test system for testing a communication system having a plurality of communication links is disclosed. The test system has a single tester for performing various measurement and diagnostic tasks on a single link. The test system also has a switching system for independently testing any link by coupling the tester into any one link. The tester is coupled into the link by coupling the tester input to the link's transmitter and the tester output to the link's receiver. The switching system couples the tester such that all remaining links of the communication system have a unique one of the plurality of transmitters coupled to a unique one of the plurality of receivers, whereby the operation of the communication system can be maintained while testing individual links.

Abstract: In accordance with illustrative embodiments, methods and apparati, which determine jitter are described. In one example embodiment, a method includes receiving a signal, wherein the signal comprises a first data pattern which was generated at a first bit rate. The method also includes sampling the signal at a second bit rate to generate a second data pattern. The period of the second bit rate is different from the period of the first bit rate. The method also includes comparing the first data pattern and the second data pattern to determine differences between the first data pattern and the second data pattern. Furthermore, the method includes determining jitter in the signal according to the differences between the first data pattern and the data second data pattern. In other embodiments, by using two different bit rates to determine jitter, jitter can be determined in communication systems in a convenient and cost effective manner.

Abstract: A method of self-testing includes transmitting a plurality of self-test signals and receiving the plurality of self-test signals. In addition, the method includes storing the received self-test signal in a first database; and comparing the received self-test signal with data from a second database. An self-testing apparatus and a method of for assuring substantially continued calibrated function of a testing device.

Abstract: A testing apparatus for testing optical components includes an optical transmitter, an optical attenuator, an optical power meter and an optical receiver which are substantially rigidly coupled in a fixed relation to each other within a single housing. The system permits the common control of all the optical components such that calibration, testing and troubleshooting may be performed using a common user interface. The testing apparatus is unitary, compact and portable, and is a much more robust testing apparatus than conventional schemes.

Abstract: A system and method for bit error rate testing optical components comprises providing an optical testing unit, which measures a bit error rate of an optical device under test (DUT) over an operating range of the DUT. The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

Abstract: An error analysis tester for an optical component includes an optical transmitter, an optical attenuator, a port, a receiver, a processor and a graphical display. The optical transmitter and optical attenuator produce a test signal at a plurality of selected optical power levels. The port is configured to output the test signal to the optical component and to receive a version of the test signal from the optical component. The receiver determines errors in the received version of the test signal. The processor determines data points of a function associated with an error rate at each of the selected power levels and a line corresponding to the data points. The graphical display produces a visual plot of the data points and the corresponding line.

Abstract: A system and method for testing the sensitivity of optical components comprises providing an optical testing unit which measures the sensitivity of an optical device under test (DUT). The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

Abstract: A system and method for testing the sensitivity of optical components comprises providing an optical testing unit which measures the sensitivity of an optical device under test (DUT). The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

Abstract: A system and method for bit error rate testing optical components comprises providing an optical testing unit, which measures a bit error rate of an optical device under test (DUT) over an operating range of the DUT. The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

Abstract: A device and method that performs error analysis of an optical component. An optical transmitter transmits a test signal at a plurality of selected optical power levels. A port outputs the test signal to the optical component, and then receives a version of the test signal from the optical component. A receiver determines errors in the received version of the test signal. A processor determines an error rate at each of the selected optical power levels based on the determined errors, and also determines an uncertainty range for each determined error rate. An interface provides indication of the determined error rates in relation to the determined uncertainty ranges.

Abstract: A modular housing device includes a modular housing having a first side and a second side, at least one component disposed with said modular housing. The modular housing device further includes a bracket disposed on the second side.

Abstract: A system and method for bit error rate testing optical components comprises providing an optical testing unit, which measures a bit error rate of an optical device under test (DUT) over an operating range of the DUT. The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

Abstract: A modular housing device includes a modular housing having a first side and a second side, and at least one component disposed with said modular housing. The modular housing device further includes a bracket disposed on the second side.

Abstract: A system and method for testing the sensitivity of optical components comprises providing an optical testing unit which measures the sensitivity of an optical device under test (DUT). The optical testing unit includes an optical transmitter, which transmits an optical test signal that is transmitted to the DUT; an optical receiver, which receives an input signal from the DUT; a graphical user interface, which provides an interface with a user; and a controller, selectively coupled to the transmitter, the receiver and the graphical user interface, wherein the controller provides a central control of the transmitter, the receiver and the graphical user interface.

Abstract: A testing apparatus and method useful in measuring the performance of a receiver when receiving a relatively high frequency jittered signal. A relatively high frequency oscillator is locked to a relatively low frequency reference with intentional jitter induced by adding jitter to the relatively low frequency reference. A divide by N circuit and a phase/frequency detector are used to detect discrepancies between the relatively low frequency reference output of the oscillator and to generate a signal used to keep the oscillator locked to the relatively low frequency reference. The addition of the jitter to the relatively low frequency reference may be controlled through digital or analog means.