Patents by Inventor William Judson Hendrix, JR.

William Judson Hendrix, JR. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring thickness of an object
    Patent number: 9441937
    Abstract: An apparatus for measuring thickness of an object is provided. The apparatus includes a compression control system which further includes a movable platform, a compression sensor, and a switching device operatively coupled to the compression sensor. The apparatus also includes a measurement system operatively coupled to the switching device for receiving a signal representative of a toggle event at the switching device and configured to measure a gradient. The apparatus also includes a processing circuit operatively coupled to the switching device and the measurement system for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device by using the gradient and a communication circuit for transmitting a measured thickness of the object to a remote database.
    Type: Grant
    Filed: December 12, 2014
    Date of Patent: September 13, 2016
    Assignee: General Electric Company
    Inventors: Yakov Polishchuk, Robert William Tait, William Judson Hendrix, Jr., Michael Francis Strong
  • METHOD AND APPARATUS FOR MEASURING THICKNESS OF AN OBJECT
    Publication number: 20150096184
    Abstract: An apparatus for measuring thickness of an object is provided. The apparatus includes a compression control system which further includes a movable platform, a compression sensor, and a switching device operatively coupled to the compression sensor. The apparatus also includes a measurement system operatively coupled to the switching device for receiving a signal representative of a toggle event at the switching device and configured to measure a gradient. The apparatus also includes a processing circuit operatively coupled to the switching device and the measurement system for measuring a thickness of the object upon receiving the signal representative of the toggle event at the switching device by using the gradient and a communication circuit for transmitting a measured thickness of the object to a remote database.
    Type: Application
    Filed: December 12, 2014
    Publication date: April 9, 2015
    Inventors: Yakov Polishchuk, Robert William Tait, William Judson Hendrix, JR., Michael Francis Strong