Patents by Inventor William L. Flower

William L. Flower has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6061641
    Abstract: This invention pertains generally to a method for improving the accuracy of particle analysis under conditions of discrete particle loading and particularly to a method for improving signal-to-noise ratio and instrument response in laser spark spectroscopic analysis of particulate emissions. Under conditions of low particle density loading (particles/m.sup.3) resulting from low overall metal concentrations and/or large particle size uniform sampling can not be guaranteed. The present invention discloses a technique for separating laser sparks that arise from sample particles from those that do not; that is, a process for systematically "gating" the instrument response arising from "sampled" particles from those responses which do not, is dislosed as a solution to his problem. The disclosed approach is based on random sampling combined with a conditional analysis of each pulse. A threshold value is determined for the ratio of the intensity of a spectral line for a given element to a baseline region.
    Type: Grant
    Filed: October 23, 1997
    Date of Patent: May 9, 2000
    Inventors: David W. Hahn, Kenneth R. Hencken, Howard A. Johnsen, William L. Flower
  • Patent number: 5953120
    Abstract: A compact optical probe is disclosed particularly useful for analysis of emissions in industrial environments. The instant invention provides a geometry for optically-based measurements that allows all optical components (source, detector, rely optics, etc.) to be located in proximity to one another. The geometry of the probe disclosed herein provides a means for making optical measurements in environments where it is difficult and/or expensive to gain access to the vicinity of a flow stream to be measured. Significantly, the lens geometry of the optical probe allows the analysis location within a flow stream being monitored to be moved while maintaining optical alignment of all components even when the optical probe is focused on a plurality of different analysis points within the flow stream.
    Type: Grant
    Filed: January 4, 1996
    Date of Patent: September 14, 1999
    Assignee: Sandia Corporation
    Inventors: Kenneth Hencken, William L. Flower
  • Patent number: 5777734
    Abstract: The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: July 7, 1998
    Assignee: Sandia Corporation
    Inventors: William L. Flower, Ronald F. Renzi