Patents by Inventor William L. Rall

William L. Rall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11410298
    Abstract: A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to the component image; applying the baseline dimensioned image to a damage detection algorithm; and determining component damage by the damage detection algorithm.
    Type: Grant
    Filed: December 5, 2018
    Date of Patent: August 9, 2022
    Assignee: Raytheon Technologies Corporation
    Inventors: Alan Matthew Finn, Jose Miguel Pasini, Edgar A. Bernal, Ozgur Erdinc, Ziyou Xiong, Gene B. Donskoy, Sergio S. Frutuoso, Joseph A. Sylvestro, Richard W. Osborne, III, Olusegun T. Oshin, William L. Rall
  • Publication number: 20190172191
    Abstract: A process for automated component inspection includes the steps of calibrating an imaging device mounted on a table; calibrating a coordinate measuring machine mounted on the table, the coordinate measuring machine comprising a fixture coupled to an arm of the coordinate measuring machine; coupling a component to the fixture; acquiring an image of said component with said imaging device; registering a baseline dimensioned image to the component image; applying the baseline dimensioned image to a damage detection algorithm; and determining component damage by the damage detection algorithm.
    Type: Application
    Filed: December 5, 2018
    Publication date: June 6, 2019
    Inventors: Alan Matthew Finn, Jose Miguel Pasini, Edgar A. Bernal, Ozgur Erdinc, Ziyou Xiong, Gene B. Donskoy, Sergio S. Frutuoso, Joseph A. Sylvestro, Richard W. Osborne, III, Olusegun T. Oshin, William L. Rall