Abstract: A system for applying RF voltages to a multipole ion processing device, configured for use in a mass spectrometer, includes a first RF generator configured to generate a first RF voltage and apply to a first pole electrode set, a second RF generator configured to generate a second RF voltage and apply to a second pole electrode set, a first amplitude adjustor configured to adjust an amplitude of the first RF voltage, a second amplitude adjustor configure to adjust an amplitude of the second RF voltage, and a phase adjustor in communication with the first RF generator and the second RF generator to adjust phase output of at least one of the first RF generator and the second RF generator so as to adjust a phase differential between the first RF voltage and the second RF voltage to be within a desired range.

Abstract: Methods and systems for controlling a filament of an electron emitter associated with an ion reaction cell in accordance with various aspects of the present teachings may account for inter-filament and inter-instrument variability and can provide improved reproducibility in EAD experiments and ease of use. In some aspects, a method of operating an ion reaction device of a mass spectrometer system is provided. The method comprises applying a calibration drive voltage to a filament of an electron emitter associated with an ion reaction cell and determining a value representative of the calibration electron emission current generated by the filament while having the calibration drive voltage applied thereto. A calibration saturation voltage can be determined by iteratively increasing the calibration drive voltage applied to the filament and determining the value of the calibration electron emission current at each corresponding calibration drive voltage until the filament reaches a saturation condition.

Abstract: A method of performing mass spectrometry is disclosed. which comprises introducing a plurality of ions into an ion guide of a mass spectrometer via an inlet orifice thereof. where the ion guide includes a plurality of rods arranged in a multipole configuration and spaced from one another to provide a passageway for transit of the ions therethrough. applying RF voltages to the rods so as to generate an electromagnetic field within the passageway for providing radial confinement of the ions passing through the passageway, identifying a space charge effect, which can adversely affect operation of the mass spectrometer, based on detection of a variation of an intensity of an ion detection signal associated with at least one ion population transmitted through said ion guide and having an m/z ratio greater than a threshold, and in response to said identification of the adverse space charge effect. adjusting at least one of frequency and amplitude of the RF voltages to counteract said space charge effect.

Abstract: In one aspect, a mass spectrometer is disclosed, which includes an ion path along which an ion beam can propagate, and an ion beam deflector positioned in the ion path and configured to modulate transfer of an ion beam received from an upstream section of the ion path to a downstream section thereof, said ion beam deflector comprising at least one electrically conductive electrode positioned relative to one another to provide an opening through which the ion beam can pass, where the two electrodes are electrically insulated relative to one another so as to allow maintaining each electrode at a DC potential independent of a DC potential at which the other electrode is maintained.

Abstract: A lens assembly for use in mass spectrometry and a method for reducing contaminant build up on ion optic components in a lens assembly for use in a mass spectrometer are disclosed herein. In various embodiments of applicant's teachings, the lens assembly comprises a plurality of ion optic components assembled to form an ion lens and a heater. The plurality of ion optic components has a generally similar expansion coefficient. The heater is operatively coupled to the ion optic components. The heater heats the ion optic components to reduce the accumulation of debris on the ion optic components. In various embodiments, the method includes receiving, in a lens assembly, ions from an ion source. The lens assembly includes a plurality of ion optic components assembled to form an ion lens, the plurality of ion optic components having a generally similar expansion coefficient. The method also comprises heating the ion optic components to a first temperature.

Abstract: A lens assembly for use in mass spectrometry and a method for reducing contaminant build up on ion optic components in a lens assembly for use in a mass spectrometer are disclosed herein. In various embodiments of applicant's teachings, the lens assembly comprises a plurality of ion optic components assembled to form an ion lens and a heater. The plurality of ion optic components has a generally similar expansion coefficient. The heater is operatively coupled to the ion optic components. The heater heats the ion optic components to reduce the accumulation of debris on the ion optic components. In various embodiments, the method includes receiving, in a lens assembly, ions from an ion source. The lens assembly includes a plurality of ion optic components assembled to form an ion lens, the plurality of ion optic components having a generally similar expansion coefficient. The method also comprises heating the ion optic components to a first temperature.

Abstract: Applicant's teachings relate to apparatuses and methods of cleaning laser optical components, particularly in, for example, but not limited to, high throughput matrix-assisted laser desorption ionization (MALDI) applications. In accordance with various embodiments of applicant's teachings, the optical component is heated.