Patents by Inventor William M. Chepolis

William M. Chepolis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7161350
    Abstract: Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 6420867
    Abstract: An apparatus and a method of detecting wide spread fatigue damage (WFD) on aircraft using the absolute conductivity of the metal. A meandering winding magnetometer (MWM) having a plurality of parallel spaced linear conductor elements are placed in proximity to the aircraft. An electromagnetic field is imposed on the aircraft and the resulting response is sensed. The response is transformed to determine the conductivity of the aircraft structure. The mapping of the conductivity of the aircraft structure produces an indication where microcracks are located in the structure. These early indications of the density, spatial distribution and spatial orientation, as well as the size, of the microcracks give the user an indication of WFD.
    Type: Grant
    Filed: March 13, 1998
    Date of Patent: July 16, 2002
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis