Patents by Inventor William Meredith

William Meredith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6128087
    Abstract: A system for evaluating the reflectance of an object (e.g., a CRT) that is coated with an anti-reflective coating material is disclosed. The quality and/or uniformity of the coating is evaluated by a reflectometer. The reflectometer is positioned relative to the object by non-contact sensors. Reflectance data gathered by the reflectometer is analyzed to determine to what extent the actual coating differs from the optimal (i.e., ideal) coating. A feedback system modifies the coating process for subsequent objects in an attempt to fine-tune the coating process and achieve optimal anti-reflective coatings.
    Type: Grant
    Filed: May 8, 1998
    Date of Patent: October 3, 2000
    Inventors: William A. Meredith, Jr., Charles C. Gammans, Kelly R. Clayton, Erik J. Bjornard, Kim D. Powers
  • Patent number: 5990984
    Abstract: An article comprising a transparent or translucent polymer substrate and a transparent or translucent coating applied thereto in which the refractive index of the coating material substantially matches the refractive index of the polymer substrate. The invention also relates to a method for making an article comprising a polymer substrate and a coating in which the refractive index of the coating substantially matches the refractive index of the polymer substrate.
    Type: Grant
    Filed: May 27, 1997
    Date of Patent: November 23, 1999
    Assignee: Viratec Thin Films, Inc.
    Inventors: William A. Meredith, Jr., Bradway F. Phillips, Jeffrey L. Kokoschke
  • Patent number: 5812405
    Abstract: A method and system for designing and manufacturing a high-performance, optimized optical interference coatings that have a minimal number of layers. Index of refraction, absorption coefficient, and thickness values are selected for each of the layers in the design so as to cause the reflectance of a coated object to be zero for a given wavelength. Materials that with the selected properties are manufactured by mixing two or more preexisting available materials.
    Type: Grant
    Filed: May 23, 1995
    Date of Patent: September 22, 1998
    Assignee: Viratec Thin Films, Inc.
    Inventor: William A. Meredith, Jr.
  • Patent number: 5772861
    Abstract: A system for evaluating the reflectance of an object (e.g., a CRT) that is coated with an anti-reflective coating material is disclosed. The quality and/or uniformity of the coating is evaluated by a reflectometer. The reflectometer is positioned relative to the object by non-contact sensors. Reflectance data gathered by the reflectometer is analyzed to determine to what extent the actual coating differs from the optimal (i.e., ideal) coating. A feedback system modifies the coating process for subsequent objects in an attempt to fine-tune the coating process and achieve optimal anti-reflective coatings for later objects passing through the system.
    Type: Grant
    Filed: October 16, 1995
    Date of Patent: June 30, 1998
    Assignee: Viratec Thin Films, Inc.
    Inventors: William A. Meredith, Jr., Charles C. Gammans, Kelly R. Clayton, Erik J. Bjornard, Kim D. Powers
  • Patent number: 5768471
    Abstract: An optical analyzer measuring the reflectivity of a moving article in an in-line sputtering deposition system. The optical analyzer includes a light source which provides a light beam. Light is reflected from an optical coating of a moving article into a concentrator, which captures and directs the reflected light to a detector. The analyzer may be mounted in an evacuable chamber in which the end walls have openings to allow passage of the article.
    Type: Grant
    Filed: December 6, 1995
    Date of Patent: June 16, 1998
    Assignee: Viratec Thin Films, Inc.
    Inventor: William A. Meredith, Jr.
  • Patent number: 5579162
    Abstract: A multilayer antireflection coating for a temperature sensitive substrate such as plastic. One layer is a DC reactively sputtered metal oxide which may be deposited quickly and without imparting a large amount of heat to the substrate. Another layer has a refractive index lower than the substrate.
    Type: Grant
    Filed: October 31, 1994
    Date of Patent: November 26, 1996
    Assignee: Viratec Thin Films, Inc.
    Inventors: Erik J. Bjornard, William A. Meredith, Jr.
  • Patent number: 5200855
    Abstract: High purity (95-99.5 percent) red, orange and yellow filters are disclosed which comprise a periodic stack of relatively low index of refraction dielectric material (L) such as SiO.sub.2 or MgF.sub.2 and absorbing relatively high index material such as silicon or Fe.sub.2 O.sub.3. Together, the low and high index materials provide a high index ratio (typically 1.7 to 2.5). The filters are fabricated according to designs such as (H/2 L H/2).sup.n, typically using only 5 to 7 layers. Despite the very small layer count, these filters provide overall optical performance which is at least the equivalent of all-dielectric filters of 30 or more layers, with color purity that is unachievable by all-dielectric filters and simple low cost design. In addition, our filters have inherently low stress levels and absorb and reflect unwanted light such as blue light.
    Type: Grant
    Filed: July 12, 1991
    Date of Patent: April 6, 1993
    Assignee: Optical Coating Laboratory, Inc.
    Inventors: William A. Meredith, Jr., Paul M. LeFebvre
  • Patent number: 5030311
    Abstract: A method and apparatus are disclosed for taping the lead (10) and tail (20) ends of a web (12) during winding of the web onto a core (14), in which a vacuum drum (72) advances tape (66) past a cutter (126) to provide tape strips (16,22) to be applied when the drum initially is lowered into contact with the empty core and subsequently is raised and lowered again by a cylinder (36) into contact with the fully wound core.
    Type: Grant
    Filed: October 2, 1989
    Date of Patent: July 9, 1991
    Assignee: Eastman Kodak Company
    Inventors: Vratislav M. Michal, William A. Meredith
  • Patent number: 4710352
    Abstract: There is disclosed a test element advancing mechanism for use in an analyzer to move such test element from station to station, and a method of doing the same. The mechanism features a support surface over which the test elements move in a predetermined direction, a test element mover for engaging and moving the test elements, means for reciprocating the mover along a surface disposed to one side of the support surface, a portion of said mover being constructed to engage the reciprocating means, and means for pivoting the mover about an axis that extends parallel to the movement direction so that the engaging means are moved into or out of contact with such test elements. The test element mover includes a lever arm emanating from one side of the reciprocating means engaging portion, constructed to interact with the pivoting means.
    Type: Grant
    Filed: September 20, 1985
    Date of Patent: December 1, 1987
    Assignee: Eastman Kodak Company
    Inventors: Daniel A. Slater, William A. Meredith, Mark J. Devaney