Patents by Inventor William P. Knappenberger

William P. Knappenberger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test system for device characterization
    Patent number: 7265534
    Abstract: Device characterization performed with a test system including a fixture and multiple frequency dependent test boards. In one embodiment, testing is performed with multiple sets of input and output test boards wherein each set is frequency dependent at different frequencies. In some examples, the test board includes an impedance transformer that is a quarter wave length of the fundamental frequency (f0) of a frequency of which the board is dependent. In some examples, S-parameters and load pull measurements are obtained for the device under test with the test boards at different frequencies.
    Type: Grant
    Filed: October 20, 2004
    Date of Patent: September 4, 2007
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Michael E. Majerus, William P. Knappenberger