Abstract: A tester includes a device under test (DUT) power supply (DPS) with and input and output includes an amplifier configured to set an output voltage of the DPS output equal to an input voltage for the DPS. The DPS has a first output stage coupled to the amplifier and configured to source and sink current at the output of the DPS between a first voltage rail and a third voltage rail. The DPS has a second output stage coupled to the amplifier and configured to source and sink current to the output of the DPS between a second voltage rail and the third voltage rail. A selection device is configured to enable the first and second output stages based on a selection input signal. The selection device is situated outside of the first and the second output stages.

Abstract: A method and apparatus for a micromachine relay is provided. A pin controller comprises at least one spring pin designed to movably couple the pin controller to a device under test (DUT) to provide signals to the DUT. The pin controller further includes a micromachine relay coupled to the at least one spring pin to control the movement of the at least one spring pin and an integrated circuit for controlling the micromachine relay.

Abstract: An apparatus to receive a response signal sent from a device under test. The apparatus includes pin electronics to identify a response signal contained in a composite signal. The composite signal is a composite, or sum, of the response signal and a test signal. The pin electronics has a driver to send the test signal to the device under test, and a receiver to receive the composite signal and to separate the response signal from the composite signal.

Abstract: A method and apparatus for a micromachine relay is provided. A pin controller comprises at least one spring pin designed to movably couple the pin controller to a device under test (DUT) to provide signals to the DUT. The pin controller further includes a micromachine relay coupled to the at least one spring pin to control the movement of the at least one spring pin and an integrated circuit for controlling the micromachine relay.

Abstract: A mixed signal integrated circuit testing system includes a system controller connected to a test head for controlling the testing operations of the mixed signal integrated circuit testing system. The test head is adapted to support a wide combination of both the analog and digital circuit testing modules. A DUT board, typically configured for a specific IC or family of ICs, is used to connect the circuit testing modules to the IC. The DUT board is connected to a DUT board interface that includes an analog DUT board interface adapter and a digital DUT board interface adapter. The digital DUT board interface adapter is connected directly to the digital circuit testing modules. The analog DUT board interface adapter is connected to a system configuration module that provides analog loading and conditioning circuitry as well as other circuitry that can be customized for testing specific ICs.

Abstract: An apparatus to receive a response signal sent from a device under test. The apparatus includes pin electronics to identify a response signal contained in a composite signal. The composite signal is a composite, or sum, of the response signal and a test signal. The pin electronics has a driver to send the test signal to the device under test, and a receiver to receive the composite signal and to separate the response signal from the composite signal.

Abstract: A programmable load circuit operable to generate a plurality of test signals is described. The programmable load circuit comprises a diode bridge coupled between an input and an output. The diode bridge compares the voltage on the input to the voltage on the output. The programmable load circuit also comprises a plurality of current sources. A first set of the plurality of current sources are coupled to intermediate nodes of the diode bridge. Additionally, the programmable load circuit comprises a switching circuit coupled between the intermediate nodes of the diode bridge and a second set of the plurality of current sources. Furthermore, the programmable load circuit also comprises a load regulator coupled to the output and the intermediate nodes of the diode bridge. The load regulator is configured to reduce leakage current on the output.

Abstract: A tracking system comprising multiple satellite units and a master unit for selectively and individually locating each satellite unit. Each satellite unit receives a search signal from the master unit and transmits a response signal to the master unit when the search signal contains a search identity code which matches a unique identity code of the satellite unit. The master unit has user controls for selecting any one of the satellite units to be located and a memory for storing the unique identity code of each satellite unit. The master unit also has an indicator circuit for indicating the strength of the response signal and a display and speaker for visually and audibly indicating the strength to a user. The master unit is programmed such that when the user selects one of satellite units to be located, the master unit transmits a search signal having a search identity code which matches the unique identity code of the selected satellite unit.