Abstract: A process for determining a quiescent power supply current (I.sub.DDQ) of a device under test (DUT) at a first node. The process includes the steps of providing a reference current to the first node and decoupling a power supply from the first node. A first node voltage is determined at a first time after the power supply is decoupled from the first node. The first node voltage is determined at a second time after the first time. If the first node voltage increases from the first time to the second time, it is indicated that the I.sub.DDQ of the DUT is less than the reference current. If the first node voltage decreases from the first time to the second time, it is indicated that the I.sub.DDQ of the DUT is greater than the reference current.

Abstract: A process for determining a quiescent power supply current (I.sub.DDQ) of a device under test (DUT) at a first node. The process includes the steps of providing a reference current to the first node and decoupling a power supply from the first node. A first node voltage is determined at a first time after the power supply is decoupled from the first node. The first node voltage is determined at a second time after the first time. If the first node voltage increases from the first time to the second time, it is indicated that the I.sub.DDQ of the DUT is less than the reference current. If the first node voltage decreases from the first time to the second time, it is indicated that the I.sub.DDQ of the DUT is greater than the reference current.

Abstract: An apparatus for a test system for testing an electronic circuit. The apparatus includes an interconnect path, a comparator, a programmable apparatus, a first Schottky diode, and a second Schottky diode. The interconnect path has a first end and a second end. The first end of the interconnect path is coupled to the electronic circuit under test. The interconnect path transmits a signal from the electronic circuit under test to the second end of the interconnect path. The comparator is coupled to the second end of the interconnect path for receiving and comparing the signal from the electronic circuit under test with a reference voltage. The comparator has a high input impedance. The comparator provides an output signal to the test system. The programmable apparatus provides a selectable first voltage and a selectable second voltage. A first Schottky diode is provided for reducing ringing of the signal from the electronic circuit under test.