Patents by Inventor William R. J. Corbin

William R. J. Corbin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory array repair where repair logic cannot operate at same operating condition as array
    Patent number: 7478291
    Abstract: Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is presented. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are presented.
    Type: Grant
    Filed: May 7, 2008
    Date of Patent: January 13, 2009
    Assignee: International Business Machines Corporation
    Inventor: William R. J. Corbin
  • MEMORY ARRAY REPAIR WHERE REPAIR LOGIC CANNOT OPERATE AT SAME OPERATING CONDITION AS ARRAY
    Publication number: 20080209256
    Abstract: Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is disclosed. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are disclosed.
    Type: Application
    Filed: May 7, 2008
    Publication date: August 28, 2008
    Inventor: William R. J. Corbin
  • Memory array repair where repair logic cannot operate at same operating condition as array
    Patent number: 7395465
    Abstract: Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is presented. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are presented.
    Type: Grant
    Filed: January 13, 2006
    Date of Patent: July 1, 2008
    Assignee: International Business Machines Corporation
    Inventor: William R. J. Corbin
  • Design structure for memory array repair where repair logic cannot operate at same operating condition as array
    Patent number: 7383475
    Abstract: Design structure for memory array repair where the repair logic cannot operate at the same operating condition as the memory array is presented. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are presented.
    Type: Grant
    Filed: October 29, 2007
    Date of Patent: June 3, 2008
    Assignee: International Business Machines Corporation
    Inventor: William R. J. Corbin