Abstract: A scanning circuit for improving the signal-to-noise ratio of the output of detector elements in an infrared detector array and for providing a more complete representation of objects within the detector elements field of view is disclosed. The circuit comprises circuitry for accumulating charges representative of the outputs of the detector elements during a charge accumulation interval and circuitry for outputting signals representative of the accumulated charges to external circuitry during an output interval. The charge integration interval is longer in duration than the output interval, thus providing increased detector element integration time.