Abstract: An edge detection system including an elongated sheet defining a longitudinal axis and having at least one edge and a sensor positioned relative to the elongated sheet, the sensor defining a scan field having a null zone, wherein the sensor is moveable relative to the sheet in a direction generally perpendicular to the longitudinal axis to align the null zone with the edge.

Abstract: An edge detection system including an elongated sheet defining a longitudinal axis and having at least one edge and a sensor positioned relative to the elongated sheet, the sensor defining a scan field having a null zone, wherein the sensor is moveable relative to the sheet in a direction generally perpendicular to the longitudinal axis to align the null zone with the edge.

Abstract: A method for determining the alignment of a rotational body. The method includes the steps of locating a sensor on an outer surface of a rotational body, targeting a reference laser beam at the sensor such that the reference laser beam intersects the sensor at a reference coordinate, and recording the reference coordinate. The method further includes rotating the rotational body about the axis of rotation of the rotational body, targeting a measurement laser beam at the sensor such that the measurement laser beam intersects the sensor at a measurement coordinate, and comparing the reference coordinate and the measurement coordinate.

Abstract: The invention is a non-contact precision measurement system and a method of measuring using the system. The surface contour of an object is measured,utilizing non-contact components, such as lasers. A measurement unit traverses a linear positioner which is parallel to the object to be measured. Then deviations are measured from a baseline reference to determine any deviations in the positioner. The measurement unit also measures the distance between the positioner and the object to produce a distance profile which is adjusted in accordance with the deviations to determine a true surface profile. This system can also be used to measure both an upper and lower surface profile to determine a thickness or to align a plurality of objects in parallel.