Abstract: A microscope for examining a specimen configured to receive a first light source or a second light source. The first light source being configured to emit a first output light through a first pupil, and the second light source being configured to emit a second output light through a second pupil that is different than the first pupil. The microscope comprises a frame, a source objective, and first and second optical assemblies. The first and second optical assemblies are removably connectable to the frame. The first optical assembly comprises a first set of optical elements that are configured to pass the first output light to an imaging pupil of the source objective, and the second optical assembly comprises a second set of optical elements configured to pass the second output light to the imaging pupil.

Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.

Abstract: An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattern of features that exhibit contrast when illuminated by a light beam.

Abstract: An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattern of features that exhibit contrast when illuminated by a light beam.