Patents by Inventor William Rudolph Heffner

William Rudolph Heffner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-wafer testing of DFB semiconductor lasers
    Patent number: 6265237
    Abstract: A method of manufacturing and testing a laser device that facilitates in-wafer testing of the laser device includes forming the laser device on a wafer and forming a light detecting device on the wafer adjacent to the laser device. The laser device should include a grating. The method further includes causing the laser device to lase while in the wafer and detecting light generated from the laser device with the light detecting device. Finally, the method includes obtaining an electro-optic parameter of the laser device from the detected light.
    Type: Grant
    Filed: December 15, 1999
    Date of Patent: July 24, 2001
    Assignee: Lucent Technologies Inc.
    Inventors: William Rudolph Heffner, John E. Johnson