Patents by Inventor William Schmitz

William Schmitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240097215
    Abstract: A method for detecting defects in battery cells includes receiving an X-Ray radiographic image of a battery cell and segmenting the X-Ray radiographic image into regions of interest using a classifier. The method includes processing the segmented X-Ray radiographic image using the classifier to identify features of the battery cell, detecting whether one or more of the features in the processed X-Ray radiographic image is defective using the classifier, and determining using the classifier whether the battery cell is defective based on whether one or more of the features in the processed X-Ray radiographic image is defective.
    Type: Application
    Filed: September 20, 2022
    Publication date: March 21, 2024
    Inventors: Diana M. WEGNER, Megan E. MCGOVERN, Dmitriy BRUDER, Sean Robert WAGNER, Tanjina AHMED, Evan William SCHMITZ
  • Patent number: 11376939
    Abstract: A seal system for retaining a seal in between a fixed quarter glass and a moveable window glass can include a first seal carrier attached to the fixed quarter glass, a second seal carrier attached to the first seal carrier, a seal retained by the first and second seal carriers, and a beauty cover disposed over the first and second seal carriers when viewed from inside a vehicle. The seal system can be assembled by attaching the first seal carrier to the quarter glass, joining the second seal carrier to the first seal carrier, placing the seal such that it is retained by the first and second seal carriers, and fitting the first and second seal carriers with the beauty cover. When assembled, the seal system retains the seal to seal the vehicle between the fixed quarter glass and the movable window glass.
    Type: Grant
    Filed: June 19, 2018
    Date of Patent: July 5, 2022
    Assignee: Faraday&Future Inc.
    Inventors: Jordan William Schmitz, Paul G. Jabra, Matthew Richard Partsch, Carlos David Tobon
  • Publication number: 20190381875
    Abstract: A seal system for retaining a seal in between a fixed quarter glass and a moveable window glass can include a first seal carrier attached to the fixed quarter glass, a second seal carrier attached to the first seal carrier, a seal retained by the first and second seal carriers, and a beauty cover disposed over the first and second seal carriers when viewed from inside a vehicle. The seal system can be assembled by attaching the first seal carrier to the quarter glass, joining the second seal carrier to the first seal carrier, placing the seal such that it is retained by the first and second seal carriers, and fitting the first and second seal carriers with the beauty cover. When assembled, the seal system retains the seal to seal the vehicle between the fixed quarter glass and the movable window glass.
    Type: Application
    Filed: June 19, 2018
    Publication date: December 19, 2019
    Inventors: Jordan William SCHMITZ, Paul G. JABRA, Matthew Richard PARTSCH, Carlos David TOBON
  • Patent number: 9829417
    Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: November 28, 2017
    Assignee: Hysitron, Inc.
    Inventors: Roger William Schmitz, Ude D. Hangen, Lucas Paul Keranen, Ryan Major, Yunje Oh, Jeremiah Vieregge, Christopher David Young
  • Patent number: 9476816
    Abstract: A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.
    Type: Grant
    Filed: November 14, 2012
    Date of Patent: October 25, 2016
    Assignee: Hysitron, Inc.
    Inventors: Roger William Schmitz, Yunje Oh
  • Publication number: 20150185117
    Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.
    Type: Application
    Filed: March 14, 2013
    Publication date: July 2, 2015
    Applicant: Hysitron, Inc.
    Inventors: Roger William Schmitz, Ude D. Hangen, Lucas Paul Keranen, Ryan Major, Yunje Oh, Jeremiah Vieregge, Christopher David Young
  • Patent number: 8959980
    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
    Type: Grant
    Filed: August 8, 2013
    Date of Patent: February 24, 2015
    Assignee: Hysitron, Inc.
    Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
  • Patent number: 8939041
    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
    Type: Grant
    Filed: February 10, 2012
    Date of Patent: January 27, 2015
    Assignee: Hysitron, Inc.
    Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
  • Publication number: 20140326707
    Abstract: A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.
    Type: Application
    Filed: November 14, 2012
    Publication date: November 6, 2014
    Inventors: Roger William Schmitz, Yunje Oh
  • Publication number: 20140293293
    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
    Type: Application
    Filed: February 10, 2012
    Publication date: October 2, 2014
    Applicant: Hysitron, Inc.
    Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
  • Patent number: 8770036
    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
    Type: Grant
    Filed: August 8, 2013
    Date of Patent: July 8, 2014
    Assignee: Hysitron, Inc.
    Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
  • Publication number: 20130319127
    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
    Type: Application
    Filed: August 8, 2013
    Publication date: December 5, 2013
    Applicant: Hysitron, Inc.
    Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
  • Publication number: 20130319071
    Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.
    Type: Application
    Filed: August 8, 2013
    Publication date: December 5, 2013
    Applicant: Hysitron, Inc.
    Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
  • Patent number: 7913941
    Abstract: The invention provides a crusher block assembly for a particulate size reduction system including a crusher block having an inboard face configured and adapted to cooperate with a swing hammer in a crusher chamber of a particulate size reduction system to crush particulate, and an outboard face for receiving an adjustment mechanism. The crusher block assembly also includes an adjustment mechanism joined to the outboard face on the crusher block. The adjustment mechanism is configured and adapted to adjust the position of the crusher block along a direction between an inboard location and an outboard location within the crusher chamber. The invention also provides a method of adjusting clearance between a swing hammer and a crusher block in a particulate size reduction system.
    Type: Grant
    Filed: August 21, 2009
    Date of Patent: March 29, 2011
    Assignee: Riley Power Inc.
    Inventors: William Schmitz, Richard N. Du Verger, Daniel P. Smith, Craig A. Penterson, Qingsheng Lin
  • Patent number: 7837138
    Abstract: The invention provides a particulate size reduction system including a grinding chamber, a center shaft defining an axis of rotation and configured for rotational motion within the grinding chamber, a wheel assembly mounted on the center shaft and at least one swing hammer mounted on the wheel assembly. The at least one swing hammer preferably includes a base portion having a first end having a mounting portion for attachment to a wheel assembly of a material treatment system, a second end, an inboard portion proximate the mounting and an outboard portion proximate the second end. The swing hammer also preferably includes a wear pad disposed on the base portion that preferably includes an interrupted surface to improve wear resistance of the swing hammer.
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: November 23, 2010
    Assignee: Riley Power, Inc.
    Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson
  • Patent number: D637632
    Type: Grant
    Filed: October 19, 2010
    Date of Patent: May 10, 2011
    Assignee: Riley Power Inc.
    Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson
  • Patent number: D660887
    Type: Grant
    Filed: March 25, 2011
    Date of Patent: May 29, 2012
    Assignee: Riley Power Inc.
    Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson, Richard N. DuVerger, Qingsheng Lin
  • Patent number: D673984
    Type: Grant
    Filed: January 4, 2012
    Date of Patent: January 8, 2013
    Assignee: Riley Power Inc.
    Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson, Richard N. DuVerger, Qingsheng Lin
  • Patent number: D684200
    Type: Grant
    Filed: March 2, 2011
    Date of Patent: June 11, 2013
    Assignee: Riley Power Inc.
    Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson
  • Patent number: D685401
    Type: Grant
    Filed: December 2, 2011
    Date of Patent: July 2, 2013
    Assignee: Riley Power Inc.
    Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson