Patents by Inventor William Schmitz
William Schmitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12059754Abstract: Systems and methods are provided for manually setting up a wire drive assembly of a welding power supply and automatically setting up welding power supply parameters. A drive roll is configured with multiple grooves for receiving multiple wires of different types and/or different diameters. A sensor can detect the configuration of the drive roll such as, for example, being configured to receive a particular wire type with a particular diameter in a particular groove, by detect a distance to the drive roll. The welding power supply can use this information to automatically set the wire speed.Type: GrantFiled: April 25, 2022Date of Patent: August 13, 2024Assignee: ILLINOIS TOOL WORKS INC.Inventors: Adam Richard Schmitz, Chris J. Roehl, Scott Ryan Rozmarynowski, Zachary William MacMullen, Lauren Goulet
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Publication number: 20240097215Abstract: A method for detecting defects in battery cells includes receiving an X-Ray radiographic image of a battery cell and segmenting the X-Ray radiographic image into regions of interest using a classifier. The method includes processing the segmented X-Ray radiographic image using the classifier to identify features of the battery cell, detecting whether one or more of the features in the processed X-Ray radiographic image is defective using the classifier, and determining using the classifier whether the battery cell is defective based on whether one or more of the features in the processed X-Ray radiographic image is defective.Type: ApplicationFiled: September 20, 2022Publication date: March 21, 2024Inventors: Diana M. WEGNER, Megan E. MCGOVERN, Dmitriy BRUDER, Sean Robert WAGNER, Tanjina AHMED, Evan William SCHMITZ
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Patent number: 11376939Abstract: A seal system for retaining a seal in between a fixed quarter glass and a moveable window glass can include a first seal carrier attached to the fixed quarter glass, a second seal carrier attached to the first seal carrier, a seal retained by the first and second seal carriers, and a beauty cover disposed over the first and second seal carriers when viewed from inside a vehicle. The seal system can be assembled by attaching the first seal carrier to the quarter glass, joining the second seal carrier to the first seal carrier, placing the seal such that it is retained by the first and second seal carriers, and fitting the first and second seal carriers with the beauty cover. When assembled, the seal system retains the seal to seal the vehicle between the fixed quarter glass and the movable window glass.Type: GrantFiled: June 19, 2018Date of Patent: July 5, 2022Assignee: Faraday&Future Inc.Inventors: Jordan William Schmitz, Paul G. Jabra, Matthew Richard Partsch, Carlos David Tobon
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Publication number: 20190381875Abstract: A seal system for retaining a seal in between a fixed quarter glass and a moveable window glass can include a first seal carrier attached to the fixed quarter glass, a second seal carrier attached to the first seal carrier, a seal retained by the first and second seal carriers, and a beauty cover disposed over the first and second seal carriers when viewed from inside a vehicle. The seal system can be assembled by attaching the first seal carrier to the quarter glass, joining the second seal carrier to the first seal carrier, placing the seal such that it is retained by the first and second seal carriers, and fitting the first and second seal carriers with the beauty cover. When assembled, the seal system retains the seal to seal the vehicle between the fixed quarter glass and the movable window glass.Type: ApplicationFiled: June 19, 2018Publication date: December 19, 2019Inventors: Jordan William SCHMITZ, Paul G. JABRA, Matthew Richard PARTSCH, Carlos David TOBON
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Patent number: 9829417Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.Type: GrantFiled: March 14, 2013Date of Patent: November 28, 2017Assignee: Hysitron, Inc.Inventors: Roger William Schmitz, Ude D. Hangen, Lucas Paul Keranen, Ryan Major, Yunje Oh, Jeremiah Vieregge, Christopher David Young
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Patent number: 9476816Abstract: A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.Type: GrantFiled: November 14, 2012Date of Patent: October 25, 2016Assignee: Hysitron, Inc.Inventors: Roger William Schmitz, Yunje Oh
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Publication number: 20150185117Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.Type: ApplicationFiled: March 14, 2013Publication date: July 2, 2015Applicant: Hysitron, Inc.Inventors: Roger William Schmitz, Ude D. Hangen, Lucas Paul Keranen, Ryan Major, Yunje Oh, Jeremiah Vieregge, Christopher David Young
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Patent number: 8959980Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.Type: GrantFiled: August 8, 2013Date of Patent: February 24, 2015Assignee: Hysitron, Inc.Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
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Patent number: 8939041Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.Type: GrantFiled: February 10, 2012Date of Patent: January 27, 2015Assignee: Hysitron, Inc.Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
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Publication number: 20140326707Abstract: A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.Type: ApplicationFiled: November 14, 2012Publication date: November 6, 2014Inventors: Roger William Schmitz, Yunje Oh
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Publication number: 20140293293Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.Type: ApplicationFiled: February 10, 2012Publication date: October 2, 2014Applicant: Hysitron, Inc.Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
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Patent number: 8770036Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.Type: GrantFiled: August 8, 2013Date of Patent: July 8, 2014Assignee: Hysitron, Inc.Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
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Publication number: 20130319127Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.Type: ApplicationFiled: August 8, 2013Publication date: December 5, 2013Applicant: Hysitron, Inc.Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
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Publication number: 20130319071Abstract: An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.Type: ApplicationFiled: August 8, 2013Publication date: December 5, 2013Applicant: Hysitron, Inc.Inventors: David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz, Oden Lee Warren, Christopher David Young
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Patent number: 7913941Abstract: The invention provides a crusher block assembly for a particulate size reduction system including a crusher block having an inboard face configured and adapted to cooperate with a swing hammer in a crusher chamber of a particulate size reduction system to crush particulate, and an outboard face for receiving an adjustment mechanism. The crusher block assembly also includes an adjustment mechanism joined to the outboard face on the crusher block. The adjustment mechanism is configured and adapted to adjust the position of the crusher block along a direction between an inboard location and an outboard location within the crusher chamber. The invention also provides a method of adjusting clearance between a swing hammer and a crusher block in a particulate size reduction system.Type: GrantFiled: August 21, 2009Date of Patent: March 29, 2011Assignee: Riley Power Inc.Inventors: William Schmitz, Richard N. Du Verger, Daniel P. Smith, Craig A. Penterson, Qingsheng Lin
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Patent number: D637632Type: GrantFiled: October 19, 2010Date of Patent: May 10, 2011Assignee: Riley Power Inc.Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson
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Patent number: D660887Type: GrantFiled: March 25, 2011Date of Patent: May 29, 2012Assignee: Riley Power Inc.Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson, Richard N. DuVerger, Qingsheng Lin
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Patent number: D673984Type: GrantFiled: January 4, 2012Date of Patent: January 8, 2013Assignee: Riley Power Inc.Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson, Richard N. DuVerger, Qingsheng Lin
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Patent number: D684200Type: GrantFiled: March 2, 2011Date of Patent: June 11, 2013Assignee: Riley Power Inc.Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson
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Patent number: D685401Type: GrantFiled: December 2, 2011Date of Patent: July 2, 2013Assignee: Riley Power Inc.Inventors: William Schmitz, Daniel P. Smith, Craig A. Penterson