Abstract: Techniques are provided for verifying the integrity of data written onto a memory device under test. A pseudo random number generator generates data patterns based on a known ‘seed’ that includes a date and time. A data storage system writes the data patterns onto the memory device under test and a reference drive. The data storage system then reads the data patterns from the memory device under test and the reference drive. Alternatively, the seed value is stored in the second memory device instead of the data pattern, and subsequently, the data storage system reads the seed value from the second memory device and regenerates the data pattern. The expected data patterns from the reference drive are compared to the data read from the memory device under test to verify whether the data storage system is operating properly.

Abstract: Techniques are provided for verifying the integrity of data written onto a memory device under test. A pseudo random number generator generates data patterns based on a known ‘seed’ that includes a date and time. A data storage system writes the data patterns onto the memory device under test and a reference drive. The data storage system then reads the data patterns from the memory device under test and the reference drive. Alternatively, the seed value is stored in the second memory device instead of the data pattern, and subsequently, the data storage system reads the seed value from the second memory device and regenerates the data pattern. The expected data patterns from the reference drive are compared to the data read from the memory device under test to verify whether the data storage system is operating properly.