Abstract: A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.

Abstract: A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.

Abstract: A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.

Abstract: A Co thin film 14 is formed through evaporation on a Si substrate 10 having a Cu sheet layer 12 between the film 14 and the substrate 10. The Si substrate 10 with an orientation (100) or (111) is used. The thickness of the Cu seed layer (12) and the Co thin film (14) are both approximately 100 nm. The Co thin film (14) is a single crystal thin film having a face-centered cubic lattice structure with an orientation of (100) or (111). The thus structured Co thin film 14 has the maximum 0.4° polar Kerr rotation angle with respect to ultraviolet light having a wavelength of 200-230 nm.

Abstract: A Co thin film 14 is formed through evaporation on a Si substrate 10 having a Cu sheet layer 12 between the film 14 and the substrate 10. The Si substrate 10 with an orientation (100) or (111) is used. The thickness of the Cu seed layer (12) and the Co thin film (14) are both approximately 100 nm. The Co thin film (14) is a single crystal thin film having a face-centered cubic lattice structure with an orientation of (100) or (111). The thus structured Co thin film 14 has the maximum 0.4.degree. polar Kerr rotation angle with respect to ultraviolet light having a wavelength of 200-230 nm.

Abstract: To obtain a magnetooptical recording medium with a magnetooptic effect suitable for ultraviolet radiation, x-layers and y-layers are sequentially laminated on a glass substrate, where x is a TbFeCo layer and y is a Pt or NdCo layer. This multilayer thin film structure can provide a hysteresis loop of a rectangular ratio 1 because a vertical magnetic anisotropic constant Ku is larger than a demagnetizing energy of 2.pi.Ms.sup.2 (where M is a saturated magnetization). FOM (Figure of Merit)=R.sqroot. [.theta..sub.k.sup.2 +.eta..sub.k.sup.2 ] where .theta..sub.k is a Kerr rotation angle and .eta..sub.k is a Kerr ellipticity) is 0.05 or more in the range of ultraviolet rays (of a wavelength of 400 nm or less).

Abstract: An apparatus for measuring magneto-optical effect includes a light source 102, a spectroscope 120, a first polarizer 150 to polarize the light with a required wavelength taken out by the spectroscope 120, means 172 for applying magnetic field on a sample 176, a second polarizer 156 to admit the light transmitted or reflected by a sample 176 to pass, a photo-detector 162 for detecting intensity of light that has passed the second polarizer 156. The light source 102 includes a heavy hydrogen lamp and the spectroscope does not contain a lens and/or prism. A light path from the light source to the photo-detector is housed in a container, and the container is filled with a gas containing no oxygen.