Patents by Inventor William W. Hicks

William W. Hicks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4340461
    Abstract: A plasma enhancing baffle plate is employed in conjunction with the anode of an RIE system to provide uniform silicon etching. The baffle plate is conductively coupled to and provided in relatively close proximity to the anode to form a constricted chamber region between anode and baffle plate. With the constricted chamber open to the RIE chamber through aperture means in the baffle plate the total surface area of the anode is increased, such that when the system is biased to operate in an RIE mode an increase in the generation of neutral etching species is effected. Various aperture arrangements may be employed to provide different patterns of neutral etching species generation, in accordance with the peculiar characteristics of the system employed.
    Type: Grant
    Filed: September 10, 1980
    Date of Patent: July 20, 1982
    Assignee: International Business Machines Corp.
    Inventors: Charles J. Hendricks, William W. Hicks, John H. Keller
  • Patent number: 4189356
    Abstract: A method and apparatus for high speed electroplating of steel rods in a bright acid copper bath. The rods bearing a nickel strike coating are supported on racks in vertical tiers, the racks making electrical connections exclusively from the ends of each rod to a cathode bar. The acid copper bath solution is subjected to constant air agitation and constantly recirculated to a heat exchanger for maintenance of a preselected temperature.
    Type: Grant
    Filed: February 27, 1978
    Date of Patent: February 19, 1980
    Assignee: Whittaker Corporation
    Inventors: Donald E. Merony, William W. Hicks, Gregory T. Parkos
  • Patent number: 4146810
    Abstract: In an ion implantation apparatus, a beam defining member such as the acceleration plate is constructed such that the member is maintained at a temperature above the condensation point of the vapor emanating from the source of charged particles, thereby preventing the vapor from condensing on the member and providing a self-cleaning effect.
    Type: Grant
    Filed: December 29, 1977
    Date of Patent: March 27, 1979
    Assignee: International Business Machines Corporation
    Inventors: William W. Hicks, John H. Keller, Joseph H. Koestner
  • Patent number: 4135097
    Abstract: In an ion beam apparatus a structure for controlling the surface potential of the target comprising an electron source adjacent to the beam for providing electrons to the beam and means between the target and source for inhibiting rectilinear radiations, i.e., electron and other particle and photon radiations between said source and said target. This prevents heating of the target by the electron source and cross-contamination between the source and the target.
    Type: Grant
    Filed: May 5, 1977
    Date of Patent: January 16, 1979
    Assignee: International Business Machines Corporation
    Inventors: John L. Forneris, William W. Hicks, John H. Keller, Charles M. McKenna, James A. Seirmarco