Abstract: An electrical test probe for a connector assembly includes an elongated contact, an elongated helical coil spring, and an elongated, electrically conductive tubular member disposed about the assembly of said elongated contact and elongated helical coil spring. The bottom portion of the tubular member includes a bullet-nosed portion which protects the spring and the contact during assembly of the electrical test probe in the connector assembly.

Abstract: An electrical test probe for a connector assembly includes an elongated contact, an elongated helical coil spring, and an elongated, electrically conductive tubular member disposed about the assembly of said elongated contact and elongated helical coil spring. The bottom portion of the tubular member includes a bullet-nosed portion which protects the spring and the contact during assembly of the electrical test probe in the connector assembly.

Abstract: A top loaded burn-in socket for forming a plurality of electrical connections between a ball gird array (BGA) package having a plurality of conductive ball leads and an electrical component is provided. The socket assembly includes a plurality of resilient electrical contacts; a cam being configured to position the contacts from a first position to a second position; a device guide plate including a plurality of openings for receiving the ball leads; and an actuating mechanism configured to interact with the cam to position the contacts, wherein an upper portion of the contacts engages the ball leads between the upper portion and an inclined surface of the device guide plate openings. Each ball is thus held in a manner that does not require the use of a hold down mechanism for effecting electrical continuity between the BGA package and the contacts of the subject burn-in socket.

Abstract: A shielded semiconductor chip carrier having a high-density external interface includes conventional printed circuit boards having plated through holes for achieving shielding of the contacts of the matrix. Two fork type connectors have molded about the distal ends thereof an annular ring of dielectric plastic material, and fork type connectors are press fit into each plated through hole, thereby locking the electrical contact within the shield formed by the plated through hole. The resulting connector provides a high-density contact matrix with each connector being electrically shielded along substantially its entire length.

Abstract: A top loaded burn-in socket for forming a plurality of electrical connections between a ball gird array (BGA) package having a plurality of conductive ball leads and an electrical component is provided. The socket assembly includes a plurality of resilient electrical contacts; a cam being configured to position the contacts from a first position to a second position; a device guide plate including a plurality of openings for receiving the ball leads; and an actuating mechanism configured to interact with the cam to position the contacts, wherein an upper portion of the contacts engages the ball leads between the upper portion and an inclined surface of the device guide plate openings. Each ball is thus held in a manner that does not require the use of a hold down mechanism for effecting electrical continuity between the BGA package and the contacts of the subject burn-in socket.

Abstract: A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for engaging a solder ball lead of an IC package, and the contact includes an intermediate collar which maintains the contact within the through hole. The helical spring is disposed about the contact, with one end thereof engaging the lower end of the collar. The other end of the helical spring has contiguous coils and is of a reduced diameter so as to extend beyond the lower end of the non-conductive substrate to make electrical contact with a printed circuit board. When the test probe is compressed between the IC package and the printed circuit board, the inherent twisting of the helical spring causes the contact to tilt and make electrical contact with the contiguous coils, thereby establishing a direct electrical path between the IC package and the printed circuit board, with minimum resistance and minimum inductance.

Abstract: A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for engaging a solder ball lead of an IC package, and the contact includes an intermediate collar which maintains the contact within the through hole. The helical spring is disposed about the contact, with one end thereof engaging the lower end of the collar. The other end of the helical spring has contiguous coils and is of a reduced diameter so as to extend beyond the lower end of the non-conductive substrate to make electrical contact with a printed circuit board. When the test probe is compressed between the IC package and the printed circuit board, the inherent twisting of the helical spring causes the contact to tilt and make electrical contact with the contiguous coils, thereby establishing a direct electrical path between the IC package and the printed circuit board, with minimum resistance and minimum inductance.

Abstract: A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for engaging a solder ball lead of an IC package, and the contact includes an intermediate collar which maintains the contact within the through hole. The helical spring is disposed about the contact, with one end thereof engaging the lower end of the collar. The other end of the helical spring has contiguous coils and is of a reduced diameter so as to extend beyond the lower end of the non-conductive substrate to make electrical contact with a printed circuit board. When the test probe is compressed between the IC package and the printed circuit board, the inherent twisting of the helical spring causes the contact to tilt and make electrical contact with the contiguous coils, thereby establishing a direct electrical path between the IC package and the printed circuit board, with minimum resistance and minimum inductance.

Abstract: A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for engaging a solder ball lead of an IC package, and the contact includes an intermediate collar which maintains the contact within the through hole. The helical spring is disposed about the contact, with one end thereof engaging the lower end of the collar. The other end of the helical spring has contiguous coils and is of a reduced diameter so as to extend beyond the lower end of the non-conductive substrate to make electrical contact with a printed circuit board. When the test probe is compressed between the IC package and the printed circuit board, the inherent twisting of the helical spring causes the contact to tilt and make electrical contact with the contiguous coils, thereby establishing a direct electrical path between the IC package and the printed circuit board, with minimum resistance and minimum inductance.

Abstract: A connector assembly is provided for solderlessly connecting an integrated circuit package to a printed circuit board. In the first embodiment of the invention, a plurality of generally cylindrical resilient electrical contacts are disposed in through holes formed in a non-conductive substrate. The contacts are formed from a single conductor that is coiled in a helical fashion to form a contact which resembles a spring. Each spring-like contact is formed to begin with an annular rim defining a contact point. The conductor is then coiled in such a manner to form diametrically equal rings which are spaced equidistant apart. The spring-like contact is then concluded with a similar annular rim as to the beginning contact point. An intermediate portion equidistant from beginning and concluding rims is formed so that a small portion of coiled turns have a diameter which is larger than the other diameters defined by the annular rim.

Abstract: A connector assembly is provided for solderless connection to a land grid array integrated circuit package. In the first embodiment of the invention, a plurality of generally &Sgr;-shaped electrical contacts are disposed in through holes formed in a non-conductive substrate. The electrical contacts are maintained within the through holes due to dimensional differences formed therebetween. In the second embodiment of the invention, a plurality of electrical contacts, each having a pad portion, are disposed in a non-conductive substrate, with the respective pad portions registering with an opening of the through hole. Each electrical contact having a spring arm extending through the non-conductive substrate from the pad portion.

Abstract: A universal production ball grid array socket is provided for use with a ball grid array package. The socket will receive a ball grid array package and in turn can be mounted or plugged into an underlying circuit board. One embodiment of the socket includes a tulip-shaped contact which is capable of receiving ball grid array ball leads of various diameters. Another embodiment of the socket includes a ball receiving contact capable of clasping an inserted ball grid array ball lead. In still another embodiment the universal production ball grid array socket is translucent allowing for visual inspection of a ball grid array package and ball grid array socket combination. Methods are provided for mounting a plurality of ball leads onto the bases of a plurality of ball receiving contacts after the contacts have been mounted within the universal production ball grid array socket.

Abstract: A universal production ball grid array socket is provided for use with a ball grid array package. The socket will receive a ball grid array package and in turn can be mounted or plugged into an underlying circuit board. One embodiment of the socket includes a tulip-shaped contact which is capable of receiving ball grid array ball leads of various diameters. Another embodiment of the socket includes a ball receiving contact capable of clasping an inserted ball grid array ball lead. In still another embodiment the universal production ball grid array socket is translucent allowing for visual inspection of a ball grid array package and ball grid array socket combination. Methods are provided for mounting a plurality of ball leads onto the bases of a plurality of ball receiving contacts after the contacts have been mounted within the universal production ball grid array socket.

Abstract: A universal production ball grid array socket is provided for use with a ball grid array package. The socket will receive a ball grid array package and in turn can be mounted or plugged into an underlying circuit board. One embodiment of the socket includes a tulip-shaped contact which is capable of receiving ball grid array ball leads of various diameters. Another embodiment of the socket includes a ball receiving contact capable of clasping an inserted ball grid array ball lead. In still another embodiment the universal production ball grid array socket is translucent allowing for visual inspection of a ball grid array package and ball grid array socket combination. Methods are provided for mounting a plurality of ball leads onto the bases of a plurality of ball receiving contacts after the contacts have been mounted within the universal production ball grid array socket.

Abstract: A universal production ball grid array socket is provided for use with a ball grid array package. The socket will receive a ball grid array package and in turn can be mounted or plugged into an underlying circuit board. One embodiment of the socket includes a tulip-shaped contact which is capable of receiving ball grid array ball leads of various diameters. Another embodiment of the socket includes a ball receiving contact capable of clasping an inserted ball grid array ball lead. In still another embodiment the universal production ball grid array socket is translucent allowing for visual inspection of a ball grid array package and ball grid array socket combination. Methods are provided for mounting a plurality of ball leads onto the bases of a plurality of ball receiving contacts after the contacts have been mounted within the universal production ball grid array socket.

Abstract: An adaptor pin for connection to a printed circuit board includes an elongated electrically conductive pin having an enlarged portion adjacent one end for forming a mechanical interference fit with a hole partially drilled through the circuit board. The pin has an enlarged cross-sectional solder portion intermediate the enlarged portion and the opposite end of the pin so as to limit the extent of penetration of the pin into the hole of the circuit board. The enlarged portion of each pin is electrically connected by soldering to a circuit path on the circuit board. By this arrangement, a rigid mechanical connection between the pin and the circuit board is effected, and thus subsequent reheating of the board for connecting a surface mounted chip to the opposite side of the board will not interfere with the electrical and mechanical connection between the adaptor pin and the circuit board.

Abstract: An electrical connector assembly is provided for releasable electrical connection of a high density memory module to a circuit board. An electrical connector assembly includes a base having an array of apertures extending therethrough for registration with both the contact pads of the memory module and of the circuit board. Resilient terminal assemblies are mounted in each of the apertures of the base. Each terminal assembly includes an electrically conductive terminal exposed at both ends of the terminal assembly and with a connection extending therebetween. The contacts and the connection of the terminal may be stamped and formed from a unitary strip of conductive metal. The terminal is insert molded in elastomeric material dimensioned to be frictionally retained in a corresponding aperture of the base.

Abstract: An adaptor pin for connection to a printed circuit board includes an elongated electrically conductive pin having an enlarged portion adjacent one end for forming a mechanical interference fit with a hole partially drilled through the circuit board. The pin has an enlarged cross-sectional solder portion intermediate the enlarged portion and the opposite end of the pin so as to limit the extent of penetration of the pin into the hole of the circuit board. The enlarged portion of each pin is electrically connected by soldering to a circuit path on the circuit board. By this arrangement, a rigid mechanical connection between the pin and the circuit board is effected, and thus subsequent reheating of the board for connecting a surface mounted chip to the opposite side of the board will not interfere with the electrical and mechanical connection between the adaptor pin and the circuit board.

Abstract: A universal LCC test socket assembly for making solderless connections between the leads of either a rectangular or square configured LCC packaged IC and a testing device includes a top member having spring biased securing members for temporarily securing a LCC packaged IC, and a base member including a plurality of electrical contacts that extend beyond the base member for electrical connection to the testing device.

Abstract: The invention disclosed herein relates to a test socket for making solderless connections between an electrical component and a printed circuit board. The socket includes a lid member that translates longitudinally with respect to a base member upon operating a cammed actuator. The lid member is connected to and guided upon the base member by a plurality of flexible linking clips. The invention includes a plurality of electrical connectors having a pair of resilient beams that are preloaded. A lead portion is formed from one of the opposed beams and extends unitarily therefrom.