Patents by Inventor Wisam Kadry

Wisam Kadry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10983887
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone then a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: April 20, 2021
    Assignees: INTERNATIONAL BUSINESS MACHINES CORPORATION, SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Publication number: 20200151074
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone then a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Application
    Filed: December 6, 2019
    Publication date: May 14, 2020
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Patent number: 10528443
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone than a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: January 7, 2020
    Assignees: SAMSUNG ELECTRONICS CO., LTD., INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Patent number: 9626267
    Abstract: A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of operation; in response to a parsed template statement being a marker statement, generating an intermediary set of one or more instructions to cause the hardware component to change the mode of operation to a second mode in accordance with the marker instruction, and modifying the expected mode of the hardware component to a second mode; and generating a second set of instructions for the hardware component, that are to be executed when operating in the second mode of operation. The generation of instructions comprises determining the expected mode and generating instructions in accordance with the expected mode of the hardware component. The generation is performed without having an expected full state of the hardware component.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: April 18, 2017
    Assignee: International Business Machines Corporation
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Patent number: 9569345
    Abstract: Localizing errors by: (i) running the testcase on a software model version of a processor to yield first testcase-run results in the form of a first set of values respectively stored in the set of data storage locations; (ii) creating a resource dependency information set based on the instructions of the testcase; (iii) running the testcase on a hardware version of the processor to yield second testcase-run results in the form of a second set of values respectively stored in the set of data storage locations; (iv) determining a set of miscompare data storage location(s), including at least a first miscompare data storage location, by comparing the first set of values and the second set of values; and (v) creating an initial dynamic slice of the data flow.
    Type: Grant
    Filed: December 27, 2013
    Date of Patent: February 14, 2017
    Assignee: International Business Machines Corporation
    Inventors: Ophir Friedler, Wisam Kadry, Amir Nahir, Vitali Sokhin
  • Publication number: 20160224448
    Abstract: A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of operation; in response to a parsed template statement being a marker statement, generating an intermediary set of one or more instructions to cause the hardware component to change the mode of operation to a second mode in accordance with the marker instruction, and modifying the expected mode of the hardware component to a second mode; and generating a second set of instructions for the hardware component, that are to be executed when operating in the second mode of operation. The generation of instructions comprises determining the expected mode and generating instructions in accordance with the expected mode of the hardware component. The generation is performed without having an expected full state of the hardware component.
    Type: Application
    Filed: January 30, 2015
    Publication date: August 4, 2016
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Publication number: 20160224452
    Abstract: A method, apparatus and computer program product to be employed by a hardware component under validation, wherein the hardware component having a plurality of processing units each belonging to one of at least two types, such that one of the at least two types of processing units is less error-prone then a remainder of the at least two types. The method comprising: designating one of the processing units of the hardware component under validation that belongs to the less error-prone type as a manager processing unit; initiating execution of a tester program code for testing processing units, by processing units of the hardware component other than the manager processing unit; and, monitoring by the manager processing unit the status of the processing units during execution of the tester program code.
    Type: Application
    Filed: January 30, 2015
    Publication date: August 4, 2016
    Inventors: Sung-Boem Park, Amir Nahir, Vitali Sokhin, Wisam Kadry, Jin Sung Park, Ara Cho
  • Patent number: 9251045
    Abstract: Localizing errors by: (i) running a testcase on a hardware processor and saving results; (ii) running the testcase on a software model of the processor and saving results; (iii) recording control flow information during the software run; (iv) determining a set of miscompare data storage locations by comparing the results from the hardware run with those from the software run; (v) based on the set of miscompare data storage locations and/or the control flow information, generating and running a modified version of the testcase that takes a different execution path when run on the software model than did the original testcase when run on the software model; and (vii) comparing the results from the hardware run and the results obtained from the modified software run to provide an indication of similarity between execution paths taken in these respective runs.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: February 2, 2016
    Assignee: International Business Machines Corporation
    Inventors: Ophir Friedler, Wisam Kadry, Amir Nahir, Vitali Sokhin
  • Publication number: 20150186250
    Abstract: Localizing errors by: (i) running the testcase on a software model version of a processor to yield first testcase-run results in the form of a first set of values respectively stored in the set of data storage locations; (ii) creating a resource dependency information set based on the instructions of the testcase; (iii) running the testcase on a hardware version of the processor to yield second testcase-run results in the form of a second set of values respectively stored in the set of data storage locations; (iv) determining a set of miscompare data storage location(s), including at least a first miscompare data storage location, by comparing the first set of values and the second set of values; and (v) creating an initial dynamic slice of the data flow.
    Type: Application
    Filed: December 27, 2013
    Publication date: July 2, 2015
    Applicant: International Business Machines Corporation
    Inventors: Ophir Friedler, Wisam Kadry, Amir Nahir, Vitali Sokhin
  • Publication number: 20150186251
    Abstract: Localizing errors by: (i) running a testcase on a hardware processor and saving results; (ii) running the testcase on a software model of the processor and saving results; (iii) recording control flow information during the software run; (iv) determining a set of miscompare data storage locations by comparing the results from the hardware run with those from the software run; (v) based on the set of miscompare data storage locations and/or the control flow information, generating and running a modified version of the testcase that takes a different execution path when run on the software model than did the original testcase when run on the software model; and (vii) comparing the results from the hardware run and the results obtained from the modified software run to provide an indication of similarity between execution paths taken in these respective runs.
    Type: Application
    Filed: February 26, 2014
    Publication date: July 2, 2015
    Applicant: International Business Machines Corporation
    Inventors: Ophir Friedler, Wisam Kadry, Amir Nahir, Vitali Sokhin
  • Patent number: 8832502
    Abstract: A method includes executing a first post-silicon testing program by a reference model. During the execution of the first post-silicon testing program, one or more test-cases are generated. The first post-silicon testing program is executed in an offline generation mode. During execution of the first post-silicon testing program each test case is generated in a different memory location. After the execution, generating a second post-silicon testing program that is configured to execute the one or more test-cases. The method further includes executing the second post-silicon testing program on an acceleration platform.
    Type: Grant
    Filed: July 25, 2012
    Date of Patent: September 9, 2014
    Assignee: International Business Machines Corporation
    Inventors: Manoj Dusanapudi, Wisam Kadry, Shakti Kapoor, Dimtry Krestyashyn, Shimon Landa, Amir Nahir, John Schumann, Gil Eliezer Shurek, Vitali Sokhin
  • Publication number: 20140032966
    Abstract: A method, apparatus and product for hardware verification using acceleration platform. The method comprising executing a first post-silicon testing program by a reference model, wherein during said executing the first post-silicon testing program one or more test-cases are generated; generating a second post-silicon testing program that is configured to execute the one or more test-cases; and executing the second post-silicon testing program on an acceleration platform.
    Type: Application
    Filed: July 25, 2012
    Publication date: January 30, 2014
    Applicant: International Business Machines Corporation
    Inventors: Manoj Dusanapudi, Wisam Kadry, Shakti Kapoor, Dimtry Krestyashyn, Shimon Landa, Amir Nahir, John Schumann, Gil (Eliezer) Shurek, Vitali Sokhin
  • Patent number: 8397217
    Abstract: Test template may comprise a source code template instruction associated with source code commands. The source code template instruction is utilized in generation of a test. The generation of instructions associated with the source code template instruction takes into account utilization of shared resources by both the source code commands and by generated instructions that are generated by other template instructions.
    Type: Grant
    Filed: February 22, 2010
    Date of Patent: March 12, 2013
    Assignee: International Business Machines Corporation
    Inventors: Alex Goryachev, Ronny Morad, Wisam Kadry, Sergey Shusterman
  • Publication number: 20110209004
    Abstract: Test template may comprise a source code template instruction associated with source code commands. The source code template instruction is utilized in generation of a test. The generation of instructions associated with the source code template instruction takes into account utilization of shared resources by both the source code commands and by generated instructions that are generated by other template instructions.
    Type: Application
    Filed: February 22, 2010
    Publication date: August 25, 2011
    Applicant: International Business Machines Corporation
    Inventors: Alex Goryachev, Ronny Morad, Wisam Kadry, Sergey Shusterman