Abstract: A method of identifying the presence, and amount, of elemental constituents in a material. The method uses an apparatus known for use in measuring extended x-ray absorption fine structure, and adapts it to the measurement of x-ray appearance potential in a manner to yield both qualitative and quantitative information about the elemental constituents of the material. The source of x-rays can be a synchrotron, which, because of its high power output, increases the speed and sensitivity of the measurements, permitting the use of less sensitive x-ray detectors to yield statistically significant data.