Patents by Inventor Wo-Sik Cho

Wo-Sik Cho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for measuring waveform of light wave based on ionization yield modulation
    Patent number: 10564043
    Abstract: The present invention relates to a apparatus and method for measuring a waveform of a light wave. A light wave measurement apparatus according to an embodiment of the present invention includes a pulse separation unit to separate an input light wave into a fundamental pulse and a signal pulse, a time delay adjustment unit to adjust a time delay between the fundamental pulse and the signal pulse, a focusing unit to focus the fundamental pulse and the signal pulse whose time delay is adjusted on an ionization material, and an ionization yield measurement unit to measure an ionization yield from electrons and/or ions generated by the focused fundamental pulse and signal pulse. The waveform of the input light wave is obtained by obtaining an ionization yield modulation changed by the signal pulse as a function of the time delay.
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: February 18, 2020
    Assignees: Institute For Basic Science, Gwangju Institute of Science And Technology
    Inventors: Kyung-Taec Kim, Chang-Hee Nam, Seung-Beom Park, Wo-Sik Cho, Kyung-Seung Kim
  • APPARATUS AND METHOD FOR MEASURING WAVEFORM OF LIGHT WAVE
    Publication number: 20180266891
    Abstract: The present invention relates to a apparatus and method for measuring a waveform of a light wave. A light wave measurement apparatus according to an embodiment of the present invention includes a pulse separation unit to separate an input light wave into a fundamental pulse and a signal pulse, a time delay adjustment unit to adjust a time delay between the fundamental pulse and the signal pulse, a focusing unit to focus the fundamental pulse and the signal pulse whose time delay is adjusted on an ionization material, and an ionization yield measurement unit to measure an ionization yield from electrons and/or ions generated by the focused fundamental pulse and signal pulse. The waveform of the input light wave is obtained by obtaining an ionization yield modulation changed by the signal pulse as a function of the time delay.
    Type: Application
    Filed: May 17, 2018
    Publication date: September 20, 2018
    Applicants: Institute for Basic Science, Gwangju Institute of Science and Technology
    Inventors: Kyung-Taec KIM, Chang-Hee Nam, Seung-Beom Park, Wo-Sik Cho, Kyung-Seung Kim