Abstract: Disclosed is a beam splitter assembly for being arranged in a non-collimated part of a beam path of a microscope with a first plate, which is tilted with respect to an optical axis by a tilting angle, and with a second plate, which is tilted with respect to the optical axis by a tilting angle, wherein the first plate and/or the second plate serve(s) for coupling radiation in and/or out. The beam splitter assembly can include a wedge angle of the first plate, a wedge angle of the second plate and the tilting angle of the second plate, which are coordinated with one another in such a way that an astigmatism on the optical axis and a linear field dependence of the astigmatism in an object field are corrected. Also disclosed are a method for dimensioning a beam splitter assembly and a microscope.

Abstract: The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Pxn), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Pxn) and a row sum is formed in each case. A correction value of the pixel (Pxn) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Pxn), of the reconstructed image, as a result of which a corrected image is obtained.

Abstract: A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot and a 3D image is generated. The pixels of the flat panel detector are divided into groups. A pre-calculated raw image is calculated for each group and are unfolded three-dimensionally to generate the image of the specimen.

Abstract: A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot. The flat panel detector is read, and, from the data of the flat panel detector and from the scanning positions assigned to these data, a 3D image of the specimen is generated.

Abstract: A method and an optical arrangement for ascertaining a resultant power of radiation in a sample plane (8) of an optical arrangement. In a step A, a current configuration of optical elements in a beam path of the optical arrangement is captured. In a step B, radiation is provided and directed into the sample plane (8) along the beam path. At least one measured value of the power of the radiation in the sample plane (8) is captured as resultant power in step C and the measured values in respect of the respectively current configuration are stored in a step D. Steps A to D are repeated for at least one further current configuration.

Abstract: The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Pxn), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Pxn) and a row sum is formed in each case. A correction value of the pixel (Pxn) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Pxn), of the reconstructed image, as a result of which a corrected image is obtained.

Abstract: In a method for high-resolution scanning microscopy of a sample, provision is made of focusing of illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot. The sample spot is imaged into an image that is static on a spatially resolving surface detector having pixels of a size that spatially resolve the image, wherein the imaging has a an optical imaging resolution limit. The entire sample is captured by performing a scanning movement of the illumination spot and of the coinciding sample spot over the sample in a scanning operation. An image of the sample having a resolution that is increased beyond the optical imaging resolution limit of the imaging is produced from the data of the pixels for each scanning position.

Abstract: The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the sample with at least

Abstract: In a method for high-resolution scanning microscopy of a sample, provision is made of focusing of illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot. The sample spot is imaged into an image that is static on a spatially resolving surface detector having pixels of a size that spatially resolve the image, wherein the imaging has a resolution limit. The entire sample is captured by performing a scanning movement of the illumination spot and of the coinciding sample spot over the sample in a scanning operation. An image of the sample having a resolution that is increased beyond the resolution limit of the imaging is produced from the data of the pixels for each scanning position. Here, a reassignment step is performed, in which data of a plurality of pixels of the surface detector, which are spaced apart in the first spatial direction, are combined for each scanning position.

Abstract: An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.

Abstract: The invention relates to a method for high-resolution luminescence microscopy of a specimen marked with marker molecules, and to a luminescence microscope for performing the method, wherein the marker molecules can be excited to emit luminescence radiation. The method for luminescence microscopy comprises the excitation and imaging of marker molecules and the transmission of a trigger time and a position of the specimen. An optical recording device images the marker molecules in a capture area and transmits data from the imaging to an image capture circuit. The recording device transmits a time for the imaging to a signal former as a trigger time; the trigger time is then transmitted to a data recorder.

Abstract: An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.

Abstract: A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.

Abstract: The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the sample with at least

Abstract: The invention relates to a method for high-resolution luminescence microscopy of a specimen marked with marker molecules, and to a luminescence microscope for performing the method, wherein the marker molecules can be excited to emit luminescence radiation. The method for luminescence microscopy comprises the excitation and imaging of marker molecules and the transmission of a trigger time and a position of the specimen. An optical recording device images the marker molecules in a capture area and transmits data from the imaging to an image capture circuit. The recording device transmits a time for the imaging to a signal former as a trigger time; the trigger time is then transmitted to a data recorder.

Abstract: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Abstract: A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another.

Abstract: The invention relates to a laser scanning microscope (LSM), consisting of at least one light source, from which an illumination beam path in the direction of a sample originates, at least one detection beam path for passing sample light, preferably fluorescence light, onto a detector arrangement, it main colour separator for separating the illumination and detection beam paths, a microlens array for generating a light source grid composed of at least two light sources, a scanner for generating a relative movement between the illumination light and the sample in at least one direction, and a microscope objective, wherein the lens array is arranged in at common part of illumination and detection beam paths.

Abstract: To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.

Abstract: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.