Patents by Inventor Wolfgang Egert

Wolfgang Egert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Single slider air bearing process using polymer brush formation
    Patent number: 6844144
    Abstract: A method of constructing an air bearing on a single slider used as a support for a magnetic recording head is described. A recessed surface of the air bearing is constructed by: applying a polymerization initiator (preferably azomonochlorsilane), forming a pattern in the initiator, forming a polymer brush, and ion milling. The application of the polymerization initiator may be from solution or by stamping.
    Type: Grant
    Filed: August 27, 2002
    Date of Patent: January 18, 2005
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Rainer Klaus Krause, Markus Schmidt, Stefan Seifried, Wolfgang Egert, Eva Urlaub, Ashok Lahiri
  • Single slider air bearing process using polymer brush formation
    Publication number: 20040043335
    Abstract: A method of constructing an air bearing on a single slider used as a support for a magnetic recording head is described. A recessed surface of the air bearing is constructed by: applying a polymerization initiator (preferably azomonochlorsilane), forming a pattern in the initiator, forming a polymer brush, and ion milling. The application of the polymerization initiator may be from solution or by stamping.
    Type: Application
    Filed: August 27, 2002
    Publication date: March 4, 2004
    Inventors: Rainer Klaus Krause, Markus Schmidt, Stefan Seifried, Wolfgang Egert, Eva Urlaub, Ashok Lahiri
  • X-ray enhanced SEM critical dimension measurement
    Patent number: 5798525
    Abstract: Structures having high height to width ratios may be measured using X-ray techniques, where the surrounding base and the structure are composed of different substances. The technique combines X-ray detection with scanning electron microscope (SEM) beam scanning. The X-ray emission is set to detect the presence of a specific substance which is either in the structure or surrounding the structure.
    Type: Grant
    Filed: June 26, 1996
    Date of Patent: August 25, 1998
    Assignee: International Business Machines Corporation
    Inventors: Peter Benizri-Carl, Wolfgang Egert, Manfred Jung, Theodore Gerard van Kessel