Abstract: A semiconductor substrate includes a first surface including an optical detection section that converts optical signals into electrical signals. The semiconductor substrate includes a second surface opposite the first surface and including one or more first contacts electrically connected to the optical detection section to communicate the electrical signals from the optical detection section to another substrate. The semiconductor substrate includes a temperature sensing element that includes a resistive structure on at least the first surface or the second surface. The resistive structure has a resistance that varies with temperature.

Abstract: An optical measurement system is provided for performing time-of-flight distance measurement with ambient light suppression. The system has a detector circuit that includes a photodetector and an additional current gain element that amplifies the photocurrent produced by the photodetector. Placement of the additional current gain element near the photodetector allows low-power optical signals to be detected without amplifying noise from sources of the system that are outside of the detector circuit, thereby allowing a high signal-to-noise ratio to be achieved. Embodiments of the system include circuitry that automatically regulates the bias voltage of the photodetector to compensate for temperature and for fabrication process variations.

Abstract: An optical measurement system includes a photodetector coupled in series with a field effect transistor (FET) that is a part of a sample and hold circuit. When the sample and hold circuit is in a sampling mode of operation, a voltage bias is applied to the FET and the photodetector is exposed to ambient light, thus resulting in a first current flow through the photodetector. One of several components can be selected in the sample and hold circuit for obtaining a desired time constant. When the sample and hold circuit is subsequently placed in a hold mode of operation, a second current flows through the photodetector due to exposing of the photodetector to a combination of ambient light and light associated with an optical measurement. A portion of the second current that is attributable to the light associated with the optical measurement is used for executing the optical measurement.

Abstract: An optical measurement system includes a photodetector coupled in series with a field effect transistor (FET) that is a part of a sample and hold circuit. When the sample and hold circuit is in a sampling mode of operation, a voltage bias is applied to the FET and the photodetector is exposed to ambient light, thus resulting in a first current flow through the photodetector. One of several components can be selected in the sample and hold circuit for obtaining a desired time constant. When the sample and hold circuit is subsequently placed in a hold mode of operation, a second current flows through the photodetector due to exposing of the photodetector to a combination of ambient light and light associated with an optical measurement. A portion of the second current that is attributable to the light associated with the optical measurement is used for executing the optical measurement.

Abstract: An optical measurement system is provided for performing time-of-flight distance measurement with ambient light suppression. The system has a detector circuit that includes a photodetector and an additional current gain element that amplifies the photocurrent produced by the photodetector. Placement of the additional current gain element near the photodetector allows low-power optical signals to be detected without amplifying noise from sources of the system that are outside of the detector circuit, thereby allowing a high signal-to-noise ratio to be achieved. Embodiments of the system include circuitry that automatically regulates the bias voltage of the photodetector to compensate for temperature and for fabrication process variations.

Abstract: An optical detection system can include a set of photodetectors and a set of pixel processing circuits for processing pixel information provided by the set of photodetectors. A set of switches interposed between the set of photodetectors and the set of pixel processing circuits can be selectively activated to place the optical detection system in a first mode of operation that allows for optical detection using a subset of pixel processing circuits. The remaining pixel processing circuits that are not used during the first mode of operation can be placed in a power down condition for conserving power. The set of switches can then be re-activated as needed, to place the optical detection system in a second mode of operation that allows for optical detection using a larger number of pixel processing circuits than used during the first mode of operation.

Abstract: An optical fiber strain sensor system and method are provided that prevent mechanical stresses exerted on the portions of the optical transmission path that leads from the measurement equipment to the structure and that leads from the structure back to the measurement equipment from having an influence on the phase difference measurement. In addition, the optical strain sensor system and method can be implemented with a reduced amount of optical fiber and a reduced number of optical connectors, thereby reducing overall system cost while improving measurement accuracy.

Abstract: An opto-sensitive device, a pixel configured for use in an opto-sensitive device, and a method of operating an opto-sensitive device are disclosed. The opto-sensitive device illustratively includes a capacitor stacked on top of a photodetector, thereby improving the fill factor of the opto-sensitive device. Transparent properties of the capacitor for a wavelength of interest ensure that the incident light is completely or mostly absorbed only within the photodetector and not within the capacitor.

Abstract: An opto-sensitive device, a pixel configured for use in an opto-sensitive device, and a method of operating an opto-sensitive device are disclosed. The opto-sensitive device illustratively includes a capacitor stacked on top of a photodetector, thereby improving the fill factor of the opto-sensitive device. Transparent properties of the capacitor for a wavelength of interest ensure that the incident light is completely or mostly absorbed only within the photodetector and not within the capacitor.