Patents by Inventor Wolfgang Maichen

Wolfgang Maichen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration device
    Patent number: 9164158
    Abstract: An example apparatus is for use in calibration of a test system having multiple channels and a socket for receiving a device under test. The example apparatus includes a device interface that is connectable to the socket; and multiple circuit paths, where each circuit path is connectable, through the device interface, to a corresponding channel of the test system and being connected to a common node. The example apparatus is configured so that, during calibration, signals either (i) each pass from the test system, through one of the multiple circuit paths, and back to the test system through others of the multiple circuit paths, or (ii) each pass from the test system, through the others of the multiple circuit paths, and back to the test system through the one of the multiple circuit paths.
    Type: Grant
    Filed: June 7, 2013
    Date of Patent: October 20, 2015
    Assignee: Teradyne, Inc.
    Inventors: Gerald H. Johnson, Babak Nikoomanesh, Chiyi Jin, Wolfgang Maichen
  • CALIBRATION DEVICE
    Publication number: 20140361798
    Abstract: An example apparatus is for use in calibration of a test system having multiple channels and a socket for receiving a device under test. The example apparatus includes a device interface that is connectable to the socket; and multiple circuit paths, where each circuit path is connectable, through the device interface, to a corresponding channel of the test system and being connected to a common node. The example apparatus is configured so that, during calibration, signals either (i) each pass from the test system, through one of the multiple circuit paths, and back to the test system through others of the multiple circuit paths, or (ii) each pass from the test system, through the others of the multiple circuit paths, and back to the test system through the one of the multiple circuit paths.
    Type: Application
    Filed: June 7, 2013
    Publication date: December 11, 2014
    Inventors: Gerald H. Johnson, Babak Nikoomanesh, Chiyi Jin, Wolfgang Maichen