Abstract: The switching contact is suitable for electrical switching devices. A contact element is connected to a contact support. In order to connect relatively large contact elements to the contact support with sufficient connection quality, in particular by means of cost-effective resistance welding or laser welding, the contact element is formed from a number of contact element segments and the individual contact element segments are assembled to make up the contact element. Different switching properties can be set by using contact element segments of the same or different material compositions and/or geometries.

Abstract: Contact pieces for vacuum switches with axial magnetic field are designed e.g. as cup contacts with slotting in the same direction which support a diskshaped contact body and have means for the suppression of eddy currents. According to the invention, the contact bodies (10, 20, 30, 40, 50) have, at least on their backside, radial areas (15, 25, 35, 45, 55) of markedly lower electrical conductivity than the base material. Such radial areas may be, grooves (15 to 18) on the backside (12) of the contact body (10), diffusion zones (25, 35) of additives reducing the electrical conductivity of the base material, or combinations of the two. If the contact bodies (40,50) are made by powder metallurgical methods, it is also possible to provide the radial areas during production as fillings (45) or as molded parts (55) of a material of lower electrical conductivity than that of the base material.

Abstract: To check the presence of operating vacuum in vacuum switches, high voltage can be applied between the contacts at a given contact spacing and the dielectric strength can be tested. According to the invention, the procedure for vacuum monitoring is that a contact spacing (h) below the nominal stroke of the vacuum switch is selected and that the X-radiation generated at this contact spacing (h) and high voltage (U) in vacuum due to the field electron emission between the contacts by the contact surfaces acting as anode is acquired and evaluated as proof of the presence of operating vacuum inside the switching tube. This method can preferably be applied to encapsulated vacuum switching tubes, in particular to SF.sub.6 -insulated switching facilities.