Patents by Inventor Wolfram Johannes Martin Lyda

Wolfram Johannes Martin Lyda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10782221
    Abstract: A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment is provided in which individual particles in the measurement environment are detected (S1), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S2), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S3), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S4).
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: September 22, 2020
    Assignees: ROBERT BOSCH GMBH, TRUMPF PHOTONIC COMPONENTS GMBH
    Inventors: Stefan Weiss, Alexander Herrmann, Robert Wolf, Alexander Van Der Lee, Wolfram Johannes Martin Lyda, Balazs Jatekos, Robert Weiss, Sören Sofke, Hans Spruit, Jens-Alrik Adrian, Matthias Falk, Dominik Moser
  • Publication number: 20200132582
    Abstract: A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment, is provided in which individual particles in the measurement environment are detected (S1), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S2), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S3), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S4).
    Type: Application
    Filed: October 21, 2019
    Publication date: April 30, 2020
    Inventors: Stefan Weiss, Alexander Herrmann, Robert Wolf, Alexander Van Der Lee, Wolfram Johannes Martin Lyda, Balazs Jatekos, Robert Weiss, Sören Sofke, Hans Spruit, Jens-Alrik Adrian, Matthias Falk, Dominik Moser