Abstract: A fine dust measurement system includes a video photographing device that photographs a target place, generates a converted image or converted data by converting all or a portion of the photographed image and transmits the converted image or converted data, and a fine dust measurement that receives the converted image or converted data from the video photographing device, and trains a deep learning model to output a fine dust concentration of the target place by inputting the received converted image or converted data into the deep learning model.

Abstract: A gate driver includes an output line coupled with a gate of a transistor, a high-side inverter including a first switch and a second switch each coupled at a first end with the output line and coupled at a second end with a first voltage source, a low-side inverter including a third switch and a fourth switch each coupled at a first end with the output line and coupled at a second end with a second voltage source, a sensor unit including a current sensor coupled with the transistor to sense a collector-emitter current of the transistor, and a control circuit coupled with the sensor unit and the first to fourth switches to turn on or turn off the transistor.

Abstract: Provided is an exciter overcurrent detection device. An overcurrent comparison part compares a current of an exciter and a reference current and output an overcurrent comparison signal. A filter outputs an overcurrent generation signal when an output value of the overcurrent comparison part maintains an overcurrent state value during a filter time. A counter cumulatively counts a time that the output value of the overcurrent comparison part corresponds to the overcurrent state value. A comparator outputs the overcurrent generation signal when a counted value of the counter exceeds a threshold value.

Abstract: A fine dust measurement system includes a video photographing device that photographs a target place, generates a converted image or converted data by converting all or a portion of the photographed image and transmits the converted image or converted data, and a fine dust measurement that receives the converted image or converted data from the video photographing device, and trains a deep learning model to output a fine dust concentration of the target place by inputting the received converted image or converted data into the deep learning model.

Abstract: In a fine dust monitoring method, it is checked whether or not a preset first measurement event occurs in an area covered by the monitoring device, an occurrence point of the first measurement event is photographed when the first measurement event occurs, and a fine dust concentration of a point where the first measurement event occurred by inputting a photographed video image according to the first measurement event is outputted to a pre-trained first deep learning model.

Abstract: Disclosed are an apparatus and a method for compensating for a phase delay of a resolver signal. The apparatus includes an input/output interface, and a processor connected to the input/output interface, wherein the processor receives a command signal and the resolver signal through the input/output interface, calculates a delay time of the resolver signal with respect to the command signal based on the command signal and the resolver signal, calculates a compensation time based on the delay time, and compensates the command signal based on the compensation time.

Abstract: Disclosed is an apparatus for excitation signal generation for a resolver. The apparatus includes a sine wave generator that generates a sine wave based on a square wave, an amplifier that amplifies the sine wave, a differential signal generator that converts, into a differential signal, the amplified sine wave, a driver that inputs the differential signal to a coil, and a processor that generates an excitation signal by increasing a voltage of the sine wave from a start voltage to a target voltage through at least one of the sine wave generator and the amplifier based on a transient current that flows into the coil in a transient response interval.

Abstract: Disclosed is a motor driving apparatus including: a motor; an inverter including a switching element for driving the motor; a controller for controlling the switching element; a resolver including an excitation winding and a detection winding; and a resolver chip applying an excitation signal to the excitation winding by inputting a periodic signal from the controller, and receiving a feedback signal from the detection winding, wherein the resolver chip determines the number of rotations of the motor based on a change in a pulse width of a detection signal resulting from a comparison between a voltage of the feedback signal and a preset voltage, and output a signal to the inverter for setting an inertial driving control mode according to the number of rotations of the motor in a failure state of the controller.

Abstract: Disclosed is an apparatus for excitation signal generation for a resolver. The apparatus includes a sine wave generator that generates a sine wave based on a square wave, an amplifier that amplifies the sine wave, a differential signal generator that converts, into a differential signal, the amplified sine wave, a driver that inputs the differential signal to a coil, and a processor that generates an excitation signal by increasing a voltage of the sine wave from a start voltage to a target voltage through at least one of the sine wave generator and the amplifier based on a transient current that flows into the coil in a transient response interval.

Abstract: A real time clock device for a vehicle may include: a register set provided with a first register, in which second time information is stored, and configured to store Real Time Clock (RTC) data including the time or date; and a data compensation circuit to block an input of a 1 second (1 s) tick to the first register and compensate for a delay time according to the block of the input of the 1 s tick to the first register by an RTC lock signal during a process of transmitting the RTC data to an external device or receiving setting data for the RTC data from the external device.

Abstract: A multi-master system includes a first master, a second master, and an integrated control circuit controlled by each of the first and second masters. The integrated control circuit includes a first dedicated block configured to provide a first function to the first master, a second dedicated block configured to provide a second function to the second master, and a global using block configured to provide a common function to each of the first and second masters.

Abstract: Provided is an operating method of a monitoring device configured to monitor a microcontroller unit including a plurality of cores. The operating method includes: transmitting a question message to a first core among the plurality of cores; receiving an answer message from a second core among the plurality of cores; determining whether an operation of the microcontroller unit is abnormal, by using the answer message; receiving answer messages from cores, except for the second core, among the plurality of cores when the operation of the microcontroller unit is abnormal; and detecting an error of each of the plurality of cores by using the received answer messages.

Abstract: A real time clock device for a vehicle may include: a register set provided with a first register, in which second time information is stored, and configured to store Real Time Clock (RTC) data including the time or date; and a data compensation circuit to block an input of a 1 second (1 s) tick to the first register and compensate for a delay time according to the block of the input of the 1 s tick to the first register by an RTC lock signal during a process of transmitting the RTC data to an external device or receiving setting data for the RTC data from the external device.

Abstract: A multi-master system includes a first master, a second master, and an integrated control circuit controlled by each of the first and second masters. The integrated control circuit includes a first dedicated block configured to provide a first function to the first master, a second dedicated block configured to provide a second function to the second master, and a global using block configured to provide a common function to each of the first and second masters.

Abstract: Provided is an operating method of a monitoring device configured to monitor a microcontroller unit including a plurality of cores. The operating method includes: transmitting a question message to a first core among the plurality of cores; receiving an answer message from a second core among the plurality of cores; determining whether an operation of the microcontroller unit is abnormal, by using the answer message; receiving answer messages from cores, except for the second core, among the plurality of cores when the operation of the microcontroller unit is abnormal; and detecting an error of each of the plurality of cores by using the received answer messages.

Abstract: A device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods, and reduce possible damage to the devices being tested. Devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency. A test handler embodying the invention may include a pre-heater for pre-heating the devices on a loading shuttle as the loading shuttle passes to a test chamber. An indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket, and tested devices from the test socket to an unloading shuttle. Heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state.

Abstract: A device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods, and reduce possible damage to the devices being tested. Devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency. A test handler embodying the invention may include a pre-heater for pre-heating the devices on a loading shuttle as the loading shuttle passes to a test chamber. An indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket, and tested devices from the test socket to an unloading shuttle. Heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state.