Abstract: A real time clock device for a vehicle may include: a register set provided with a first register, in which second time information is stored, and configured to store Real Time Clock (RTC) data including the time or date; and a data compensation circuit to block an input of a 1 second (1 s) tick to the first register and compensate for a delay time according to the block of the input of the 1 s tick to the first register by an RTC lock signal during a process of transmitting the RTC data to an external device or receiving setting data for the RTC data from the external device.

Abstract: A multi-master system includes a first master, a second master, and an integrated control circuit controlled by each of the first and second masters. The integrated control circuit includes a first dedicated block configured to provide a first function to the first master, a second dedicated block configured to provide a second function to the second master, and a global using block configured to provide a common function to each of the first and second masters.

Abstract: Provided is an operating method of a monitoring device configured to monitor a microcontroller unit including a plurality of cores. The operating method includes: transmitting a question message to a first core among the plurality of cores; receiving an answer message from a second core among the plurality of cores; determining whether an operation of the microcontroller unit is abnormal, by using the answer message; receiving answer messages from cores, except for the second core, among the plurality of cores when the operation of the microcontroller unit is abnormal; and detecting an error of each of the plurality of cores by using the received answer messages.

Abstract: A real time clock device for a vehicle may include: a register set provided with a first register, in which second time information is stored, and configured to store Real Time Clock (RTC) data including the time or date; and a data compensation circuit to block an input of a 1 second (1 s) tick to the first register and compensate for a delay time according to the block of the input of the 1 s tick to the first register by an RTC lock signal during a process of transmitting the RTC data to an external device or receiving setting data for the RTC data from the external device.

Abstract: A multi-master system includes a first master, a second master, and an integrated control circuit controlled by each of the first and second masters. The integrated control circuit includes a first dedicated block configured to provide a first function to the first master, a second dedicated block configured to provide a second function to the second master, and a global using block configured to provide a common function to each of the first and second masters.

Abstract: Provided is an operating method of a monitoring device configured to monitor a microcontroller unit including a plurality of cores. The operating method includes: transmitting a question message to a first core among the plurality of cores; receiving an answer message from a second core among the plurality of cores; determining whether an operation of the microcontroller unit is abnormal, by using the answer message; receiving answer messages from cores, except for the second core, among the plurality of cores when the operation of the microcontroller unit is abnormal; and detecting an error of each of the plurality of cores by using the received answer messages.

Abstract: A device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods, and reduce possible damage to the devices being tested. Devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency. A test handler embodying the invention may include a pre-heater for pre-heating the devices on a loading shuttle as the loading shuttle passes to a test chamber. An indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket, and tested devices from the test socket to an unloading shuttle. Heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state.

Abstract: A device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods, and reduce possible damage to the devices being tested. Devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency. A test handler embodying the invention may include a pre-heater for pre-heating the devices on a loading shuttle as the loading shuttle passes to a test chamber. An indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket, and tested devices from the test socket to an unloading shuttle. Heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state.