Patents by Inventor Won-Shik Baek

Won-Shik Baek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5236859
    Abstract: There is disclosed a stacked capacitor with high capacity which ensures structural stability in a DRAM cell and a method for manufacturing the same. The stacked-capacitor is of a hollow (or cylindrical) capacitor where both ends of several polysilicon layers which form a storage electrode are connected with each other. In construction, this inventive stacked-capacitor includes: a first polysilicon layer coupled to the source region so as to extend in parallel with surface of the substrate over the left and right sides of the source region; a bridge polysilicon layer, extending in the upward direction of the substrate from both ends of the first polysilicon layer; a dielectric film formed so as to contact with the surfaces of the bridge polysilicon layer, first polysilicon layer, second polysilicon layer; and a third polysilicon layer formed so as to contact with the surface of the dielectric film.
    Type: Grant
    Filed: December 10, 1991
    Date of Patent: August 17, 1993
    Assignee: SamSung Electronics Co., Ltd.
    Inventors: Dong-Joo Bae, Won-Shik Baek, Kyu-Hyun Choi
  • Patent number: 5187548
    Abstract: There is disclosed a stacked capacitor comprising a fin-shaped storage electrode of multiple polysilicon layers with supporting layers therebetween so as to compensate for the structural weakness of the fin-shaped storage electrode.
    Type: Grant
    Filed: September 28, 1990
    Date of Patent: February 16, 1993
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Won-Shik Baek, Kyu-Hyun Choi, Dong-Joo Bae
  • Patent number: 5135883
    Abstract: A stacked capacitor of the fin-like structure is provided wherein the plurality of polysilicon layers constituting the storage electrode are connected with each other in the sawtooth-like manner to overcome the structural instability of the fin-like structure. The polysilicon layers constituting the storage electrode are extended overlaying each other, so that the capacity of the capacitor in a highly integrated DRAM may be increased without increasing the area occupied by the capacitor.
    Type: Grant
    Filed: September 14, 1990
    Date of Patent: August 4, 1992
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-Joo Bae, Kyu-Hyun Chio, Won-Shik Baek
  • Patent number: 5095346
    Abstract: There is disclosed a stacked capacitor with high capacity which ensures structural stability in a DRAM cell and a method for manufacturing the same. The stacked-capacitor is of a hollow (or cylindrical) capacitor where both ends of several polysilicon layers which form a storage electrode are connected with each other. In construction, this inventive stacked-capacitor includes: a first polysilicon layer coupled to the source region so as to extend in parallel with surface of the substrate over the left and right sides of the source region; a bridge polysilicon layer, extending in the upward direction of the substrate from both ends of the first polysilicon layer; a dielectric film formed so as to contact with the surfaces of the bridge polysilicon layer, first polysilicon layer, second polysilicon layer; and a third polysilicon layer formed so as to contact with the surface of the dielectric film.
    Type: Grant
    Filed: August 31, 1990
    Date of Patent: March 10, 1992
    Assignee: SamSung Electronics Co., Ltd.
    Inventors: Dong-Joo Bae, Won-Shik Baek, Kyu-Hyun Choi