Abstract: Disclosed are an image encoding method using a skip mode and a device using the method. The image encoding method may comprise the steps of: judging whether there is residual block data of a prediction target block on the basis of predetermined data indicating whether residual block data has been encoded; and, if there is residual block data, restoring the prediction target block on the basis of the residual block data and an intra-screen predictive value of the prediction target block. Consequently, encoding and decoding efficiency can be increased by carrying out the encoding and decoding of screen residual data only for prediction target blocks where there is a need for a residual data block in accordance with screen similarity.

Abstract: An electroluminescent device includes a first electrode and a second electrode facing each other; an emission layer disposed between the first electrode and the second electrode and including a plurality of quantum dots and a first hole transporting material having a substituted or unsubstituted C4 to C20 alkyl group attached to a backbone structure; a hole transport layer disposed between the emission layer and the first electrode and including a second hole transporting material; and an electron transport layer disposed between the emission layer and the second electrode.

Abstract: Disclosed is a method for pre-detecting a defective porous polymer substrate for a separator, including selecting a porous polymer substrate having a plurality of pores; observing the selected porous polymer substrate with a scanning electron microscope (SEM) to obtain an image of the porous polymer substrate; quantifying the average value of pore distribution index (PDI); correcting the quantified average value of pore distribution index to obtain the corrected average value of pore distribution index; determining whether or not the corrected average value of pore distribution index is 60 a.u. (arbitrary unit) or less; and classifying the porous polymer substrate as a good product, when the corrected average value of pore distribution index is determined to be 60 a.u. or less, and classifying the porous polymer substrate as a defective product, when the corrected average value of pore distribution index is determined to be larger than 60 a.u.

Abstract: A quantum dot light-emitting device including first electrode and a second electrode, a quantum dot layer between the first electrode and the second electrode, a first electron transport layer and a second electron layer disposed between the quantum dot layer and the second electrode. The second electron transport layer is disposed between the quantum dot layer and the first electron transport layer, wherein each of the first electron transport layer and the second electron transport layer includes an inorganic material. A lowest unoccupied molecular orbital energy level of the second electron transport layer is shallower than a lowest unoccupied molecular orbital energy level of the first electron transport layer, and a lowest unoccupied molecular orbital energy level of the quantum dot layer is shallower than a lowest unoccupied molecular orbital energy level of the second electron transport layer. An electronic device including the quantum dot light-emitting device.

Abstract: A semiconductor device includes, first and second source/drain patterns on an active pattern and spaced apart from each other, a first source/drain contact on the first source/drain pattern and including a first source/drain barrier film and a first source/drain filling film on the first source/drain barrier film, a second source/drain contact on the second source/drain pattern, and a gate structure on the active pattern between the first and second source/drain contacts and including a gate electrode, wherein a top surface of the first source/drain contact is lower than a top surface of the gate structure, and a height from a top surface of the active pattern to a top surface of the first source/drain barrier film is less than a height from the top surface of the active pattern to a top surface of the first source/drain filling film.

Abstract: The present invention provides a low pressure and low temperature steam cleaner for washing vehicles. A vaporizing unit which vaporizes water at low temperature and low pressure is used to supply steam through a delivery device, such as a wand, to clean a car. The steam supplied is applied to the car, often with various chemicals, to lift and remove dirt and debris. Because the steam is supplied at low temperature and pressure, very little water and/or chemicals are needed, and the propensity of damaging the car's finish is reduced. For similar reasons, one can use the same device to clean the interior of the car (including generally water-averse materials such as fabrics and leather), thus, providing the above described advantages.

Abstract: The user cell is received from the FRIA (Frame Relay Interface Apparatus) for thereby performing a connection identifier-based usage parameter control function, and the user cell which follows the permitted traffic and the IPC cell received from the FRIA through the IPC bus are multiplexed and synchronized to the module clock of the clock generator. The thusly synchronized user cell and IPC cell are transmitted to the ATM switch which is away by a few meters. The head data of the ATM cell received from the ATM switch is analyzed. In the case of the user cell, the frame relay interface apparatus identifier is analyzed, and the cell is transmitted to a corresponding FRIA in accordance with a corresponding virtual path identifier and virtual channel identifier value, and in the case of the IPC cell and OAM cell, the processor processes the cell using the AAL5 reassembling unit, so that it is possible to provide a cell transmission function between the frame relay interface apparatus and the ATM switching system.

Abstract: A test method for testing an integrated circuit (IC) device, including a step of checking the handler contacts with IC devices to be tested after a test apparatus and a handler are completely set up and before actual testing operations commence. The handler contact check device includes a handler contact check board mounted to the handler, which is provided with a plurality of pins directly contacting outer terminals of the IC devices, and wiring circuits for transferring contact check electrical signals from a test apparatus to the contacts between the plurality of pins and the outer terminals, and for transferring output electrical signals from the contacts to the test apparatus, and a contact check package device having the same shape and outer terminals as the IC devices to be tested.