Patents by Inventor Won-Woo Son

Won-Woo Son has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for testing smart card and method of testing the smart card
    Patent number: 7181665
    Abstract: Devices and methods are provided for testing various types of smart cards including contact, contactless, and hybrid type (contact/contactless) smart cards. A test device includes a logic tester, a contactless interface unit, and a contact interface unit. The logic tester generates a test pattern that is transmitted to a smart card to test the smart card and compares a received response pattern with a response pattern to test a status of the smart card. The contactless interface unit enables a contactless test mode of operation and the contact interface unit enables a contact test mode of operation.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: February 20, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Won-Woo Son
  • Device for testing smart card and method of testing the smart card
    Publication number: 20050034028
    Abstract: Devices and methods are provided for testing various types of smart cards including contact, contactless, and hybrid type (contact/contactless) smart cards. A test device includes a logic tester, a contactless interface unit, and a contact interface unit. The logic tester generates a test pattern that is transmitted to a smart card to test the smart card and compares a received response pattern with a response pattern to test a status of the smart card. The contactless interface unit enables a contactless test mode of operation and the contact interface unit enables a contact test mode of operation.
    Type: Application
    Filed: August 5, 2004
    Publication date: February 10, 2005
    Inventor: Won-Woo Son