Abstract: A portable sound equipment comprising a neckband wire configured to wrap a predetermined region of a user's neck, a main body coupled to both ends of the neckband wire and configured to form an electric control unit, a first button hole configured to form an open portion in the main body; a first button exposed outside via the first buttonhole, a side case configured to cover a first area of the main body which includes the first button hole, and a drainage groove provide in the first area along a circumference of the first button hole and forming a step with an outer surface of the main body is provided, so as to enhance the waterproof structure and realize the slim design and light weight.

Abstract: A portable sound equipment comprising a neckband wire configured to wrap a predetermined region of a user's neck, a main body coupled to both ends of the neckband wire and configured to form an electric control unit, a first button hole configured to form an open portion in the main body; a first button exposed outside via the first buttonhole, a side case configured to cover a first area of the main body which includes the first button hole, and a drainage groove provide in the first area along a circumference of the first button hole and forming a step with an outer surface of the main body is provided, so as to enhance the waterproof structure and realize the slim design and light weight.

Abstract: Embodiments of the invention include on-chip transistor degradation detection and compensation. In one embodiment of the invention, an integrated circuit is provided including a circuit with a body bias terminal coupled to a body of one or more transistors to receive a body bias voltage; a programmable degradation monitor to detect aging of transistors, and a body bias voltage generator coupled to the circuit and the programmable degradation monitor. The body bias voltage generator to adjust the body bias voltage coupled into the circuit in response to transistor aging detected by the programmable degradation monitor. The programmable degradation monitor includes a reference ring oscillator, an aged ring oscillator, and a comparison circuit. The comparison circuit to compare data delays in the reference ring oscillator and the aged ring oscillator to detect transistor aging within the integrated circuit.

Abstract: Embodiments of the invention include on-chip transistor degradation detection and compensation. In one embodiment of the invention, an integrated circuit is provided including a circuit with a body bias terminal coupled to a body of one or more transistors to receive a body bias voltage; a programmable degradation monitor to detect aging of transistors, and a body bias voltage generator coupled to the circuit and the programmable degradation monitor. The body bias voltage generator to adjust the body bias voltage coupled into the circuit in response to transistor aging detected by the programmable degradation monitor. The programmable degradation monitor includes a reference ring oscillator, an aged ring oscillator, and a comparison circuit. The comparison circuit to compare data delays in the reference ring oscillator and the aged ring oscillator to detect transistor aging within the integrated circuit.