Patents by Inventor Won Jong Yoo

Won Jong Yoo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230204562
    Abstract: A nanopore device for detecting charged biopolymer molecules and defining a nanochannel, includes a first gating nanoelectrode addressing a first end of the nanochannel. The device also includes a second gating nanoelectrode addressing a second end of the nanochannel opposite the first end. The device further includes a first sensing nanoelectrode addressing a first location in the nanochannel between the first and second ends.
    Type: Application
    Filed: February 28, 2023
    Publication date: June 29, 2023
    Applicant: PALOGEN, INC.
    Inventors: Bita Karimirad, Kyung Joon Han, Reza Rahighi Yazdi, Won Jong Yoo
  • Publication number: 20200033319
    Abstract: A nanopore device for detecting charged biopolymer molecules and defining a nanochannel, includes a first gating nanoelectrode addressing a first end of the nanochannel. The device also includes a second gating nanoelectrode addressing a second end of the nanochannel opposite the first end. The device further includes a first sensing nanoelectrode addressing a first location in the nanochannel between the first and second ends.
    Type: Application
    Filed: July 27, 2019
    Publication date: January 30, 2020
    Applicant: PALOGEN, INC.
    Inventors: Bita Karimirad, Kyung Joon Han, Reza Rahighi Yazdi, Won Jong Yoo
  • Patent number: 9263607
    Abstract: A photodetector using graphene includes: a gate electrode; a graphene channel layer which is opposite to and spaced apart from the gate electrode and does not have ?-binding; a first electrode which contacts a first side of the graphene channel layer; and a second electrode which contacts a side of the graphene channel layer, where the first and second sides are opposite to each other, and where the graphene channel layer includes a first graphene layer and a first nanoparticle disposed on the first graphene layer. The first graphene layer may include a single graphene layer, or the first graphene layer may include a plurality of single graphene layers, which is sequentially stacked and does not have ?-binding.
    Type: Grant
    Filed: January 23, 2013
    Date of Patent: February 16, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Won Jong Yoo, Hua-Min Li
  • Publication number: 20130285018
    Abstract: A photodetector using graphene includes: a gate electrode; a graphene channel layer which is opposite to and spaced apart from the gate electrode and does not have ?-binding; a first electrode which contacts a first side of the graphene channel layer; and a second electrode which contacts a side of the graphene channel layer, where the first and second sides are opposite to each other, and where the graphene channel layer includes a first graphene layer and a first nanoparticle disposed on the first graphene layer. The first graphene layer may include a single graphene layer, or the first graphene layer may include a plurality of single graphene layers, which is sequentially stacked and does not have ?-binding.
    Type: Application
    Filed: January 23, 2013
    Publication date: October 31, 2013
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Won Jong YOO, Hua-Min LI
  • Publication number: 20090189215
    Abstract: A method of producing metallic nanocrystals (107) embedded in high-k dielectric material as well as a nonvolatile flash memory device (100) comprising a discrete charge carrier storage layer, the discrete charge carrier storage layer comprising metallic nanocrystals (107) embedded in high-k dielectric material. In the method described in this invention, firstly an ultra-thin metal film is deposited over a first (105) and a second (106) dielectric layer including high-k dielectric material provided on a substrate (101). Then, the ultra-thin metal film is annealed for forming the metallic nanocrystals (107) on the second dielectric layer (106). Finally, the second dielectric layer (106) and the metallic nanocrystals (107) are covered with a third dielectric layer (108) of high-k dielectric material for forming metallic nanocrystals (107) embedded in high-k dielectric material.
    Type: Application
    Filed: April 20, 2005
    Publication date: July 30, 2009
    Applicant: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Santanu Kumar Samanta, Won Jong Yoo
  • Publication number: 20090039417
    Abstract: A method of producing dielectric oxide nanodots (104) embedded in silicon dioxide as well as a nonvolatile flash memory device comprising a trapping layer (224), the trapping layer (224) comprising dielectric oxide nanodots (104) embedded in silicon dioxide are presented. Firstly an ultra-thin metal film is deposited over a first dielectric layer including silicon dioxide provided on a substrate. Then, the ultra-thin metal film is annealed for forming metallic nanodots (104) on the first dielectric layer. Afterwards, the metallic nanodots (104) are annealed for forming dielectric oxide nanodots (104) on the first dielectric layer. Finally, the first dielectric layer and the dielectric oxide nanodots (104) are covered with a second dielectric layer of silicon dioxide for forming dielectric oxide nanodots (104) embedded in silicon dioxide.
    Type: Application
    Filed: February 17, 2005
    Publication date: February 12, 2009
    Applicant: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Jinghao Chen, Won Jong Yoo, Siu Hung Daniel Chan
  • Patent number: 6387774
    Abstract: A method for patterning a layer of a microelectronic device includes the step of forming an etching mask on the layer to be etched opposite the microelectronic substrate. The etching mask defines exposed portions of the material layer and the etching mask has a notch in the sidewall thereof adjacent the material layer. The exposed portions of the material layer are then etched. More particularly, the step of forming the etching mask can include the steps of forming a first patterned mask layer on the layer to be etched and forming a second patterned mask layer on the first patterned mask layer wherein the second patterned mask layer extends beyond the first patterned mask layer thereby defining the notch in the sidewall of the etching mask.
    Type: Grant
    Filed: September 3, 1997
    Date of Patent: May 14, 2002
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Won Jong Yoo
  • Patent number: 6117746
    Abstract: A method for patterning a layer of a microelectronic device includes the step of forming an etching mask on the layer to be etched opposite the microelectronic substrate. The etching mask defines exposed portions of the material layer and the etching mask has a notch in the sidewall thereof adjacent the material layer. The exposed portions of the material layer are then etched. More particularly, the step of forming the etching mask can include the steps of forming a first patterned mask layer on the layer to be etched and forming a second patterned mask layer on the first patterned mask layer wherein the second patterned mask layer extends beyond the first patterned mask layer thereby defining the notch in the sidewall of the etching mask.
    Type: Grant
    Filed: September 3, 1997
    Date of Patent: September 12, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Won Jong Yoo