Abstract: An automated driving system of a vehicle includes a driver monitoring unit configured to perform at least one of monitoring a gaze of a driver and determining a position of a hand of the driver, an automated-driving-level switching unit configured to determine whether a transition of a driving control over the vehicle is required based on whether driving environment of the vehicle has changed during the vehicle being driven under control of the automated driving system, and determine an automated driving level to be switched based on a driver monitoring result obtained by the drive monitoring unit, and an automated driving control unit configured to control the vehicle according to the automated driving level.

Abstract: Disclosed are an electronic apparatus capable of applying the design of a UI component based on the device's usage environment and the operating method thereof. The present invention presents an electronic apparatus capable of dynamically changing and applying the design of a UI component configuring an application according to a usage environment of an electronic apparatus which drives the application and the operating method thereof to provide an appropriate UI design according to the device's usage environment of a user to the user.

Abstract: Proposed is a method of selectively leaching lithium (Li) and aluminum (Al) from a mixed carbonate precipitate (MCP) and, more specifically, a method of selectively leaching Li and Al from an MCP, by which a high-purity MCP can be prepared through selective leaching of Li and Al contained in an MCP used as a raw material for recovering valuable metals including nickel (Ni), cobalt (Co), and manganese (Mn).

Abstract: A razor assembly is proposed. The razor assembly may include a blade housing configured to receive at least one or more shaving blades in a longitudinal direction. The razor assembly may also include a connector disposed on the rear side of the blade housing and a spin housing coupled to the connector. The razor assembly may further include a fixing housing coupled to the spin housing and configured to render the spin housing to be rotatable about a first rotational axis perpendicular to the longitudinal direction. The razor assembly may further include a first restoring force-providing unit configured to provide a restoring force for restoring the spin housing to a first rest position when the spin housing is rotated about the first rotational axis relative to the fixing housing.

Abstract: Disclosed is technology that recommends an appropriate design template to each component constituting the UI to a UI developer by considering the platform related to an industrial classification of a UI to be developed by the UI developer, a job of a user who is to use the UI, and a target product to which the UI is to be applied to support the UI developer to more easily develop a UI in a direction desired by the UI developer.

Abstract: There is provided a method and an apparatus for processing a disordered voice. A method for processing a disordered voice according to an exemplary embodiment of the present invention includes: receiving a voice signal; recognizing the voice signal by phoneme; extracting multiple voice components from the voice signal; acquiring restored voice components by processing at least some disordered voice components of the multiple voice components by phoneme; and synthesizing a restored voice signal based on at least the restored voice components.

Abstract: There is provided a method and an apparatus for processing a disordered voice. A method for processing a disordered voice according to an exemplary embodiment of the present invention includes: receiving a voice signal; recognizing the voice signal by phoneme; extracting multiple voice components from the voice signal; acquiring restored voice components by processing at least some disordered voice components of the multiple voice components by phoneme; and synthesizing a restored voice signal based on at least the restored voice components.

Abstract: A method and apparatus adaptively controlling a page open time for a memory device are disclosed. The method includes determining a page open maintenance time of an access-requested page based on system information and intellectual property (IP) request information; and controlling closing of an open page based on the determined page open maintenance time.

Abstract: Provided is a memory device configured to store data having a first characteristic and a second characteristic in a memory region optimized to store data having the first characteristic and the second characteristic. The memory device includes a plurality of memory regions and a region determination unit configured to receive data, select a memory region appropriate for storing the received data, and store the data in the selected memory region. Correspondingly, performance degradation of the memory device may be prevented.

Abstract: The present invention relates to a coupling structure between a backlight and an inverter of a liquid crystal display device, and more specifically to a coupling structure between a backlight and an inverter of a liquid crystal display in which assembly between an inverter and a backlight is simplified to improve workability as well as wiring is not exposed to be clean in appearance.

Abstract: A method and apparatus adaptively controlling a page open time for a memory device are disclosed. The method includes determining a page open maintenance time of an access-requested page based on system information and intellectual property (IP) request information; and controlling closing of an open page based on the determined page open maintenance time.

Abstract: A semiconductor memory device includes a test address generating circuit configured on the device. The test address generating circuit generates a plurality of test addresses for a test of the semiconductor memory device in response to at least one externally applied test address generation signal. As a result, the number of DUTs can increase, based on a reduction of required address pins, and manufacturing productivity and test efficiency of semiconductor memory devices can increase.

Abstract: Disclosed is a pumping voltage generating circuit in a nonvolatile semiconductor memory device. The present pumping voltage generating circuit begins a pumping operation for a wordline voltage in response to an accelerating start signal activated from a supply of an external program voltage, rather than a pumping enable signal activated from a program command. According to the pumping voltage generating circuit, the wordline voltage reaches a target voltage earlier, remarkably enhancing an overall operation speed in a nonvolatile semiconductor memory device.

Abstract: Embodiments of the invention connect a plurality of devices under test (DUTS) in a parallel manner and a high test current is selectively applied to each DUT. The apparatus to test a plurality of DUTs includes a plurality of power sources providing the test current to a plurality of DUTs; and switching devices connected to the respective DUTs and power sources and selectively providing the test current. In addition, the apparatus has at least one control unit to control the switching devices. Furthermore, a group of DUTs from the plurality of DUTs is connected between two of the plurality of power sources in a parallel manner, and the test current is selectively provided to one DUT from the group of DUTs according to the operation of the switching devices.

Abstract: A circuit and method for generating a wordline voltage in a nonvolatile semiconductor memory device. The circuit comprises a switching unit to provide an external program voltage as the wordline voltage, together with a wordline voltage pump to generate the wordline voltage by pumping a power source voltage. After the wordline voltage is raised to a first level by the external program voltage, it is further increased by a pumping operation. According the circuit and method described herein, shortens the time required to reach a target voltage.

Abstract: A circuit and method for generating a wordline voltage in a nonvolatile semiconductor memory device. The circuit comprises a switching unit to provide an external program voltage as the wordline voltage, together with a wordline voltage pump to generate the wordline voltage by pumping a power source voltage. After the wordline voltage is raised to a first level by the external program voltage, it is further increased by a pumping operation. According the circuit and method described herein, shortens the time required to reach a target voltage.

Abstract: Disclosed is a pumping voltage generating circuit in a nonvolatile semiconductor memory device. The present pumping voltage generating circuit begins a pumping operation for a wordline voltage in response to an accelerating start signal activated from a supply of an external program voltage, rather than a pumping enable signal activated from a program command. According to the pumping voltage generating circuit, the wordline voltage reaches a target voltage earlier, remarkably enhancing an overall operation speed in a nonvolatile semiconductor memory device.

Abstract: Embodiments of the invention connect a plurality of devices under test (DUTS) in a parallel manner and a high test current is selectively applied to each DUT. The apparatus to test a plurality of DUTs includes a plurality of power sources providing the test current to a plurality of DUTs; and switching devices connected to the respective DUTs and power sources and selectively providing the test current. In addition, the apparatus has at least one control unit to control the switching devices. Furthermore, a group of DUTs from the plurality of DUTs is connected between two of the plurality of power sources in a parallel manner, and the test current is selectively provided to one DUT from the group of DUTs according to the operation of the switching devices.

Abstract: An etching end point detector and its related method of use detect a point of time when an etching process ends by using plasma light generated during a plasma process in a chamber of plasma etching equipment. The detector comprises an optical device receiving light generated in a chamber during the etching process and producing from the light a plurality of optical signals having different corresponding wavelengths; signal converting means receiving the plurality of optical signals and converting the plurality of optical signals into corresponding light intensity values indicating an intensity of the corresponding optical signal; and a signal processor accumulating selected ones of the light intensity values corresponding to predetermined wavelengths to produce an EPD value, and in response to the EPD value, determining an end point of the etching process.