Abstract: Disclosed is a ferroelectric memory device having a memory cell structure where a plurality of ferroelectric capacitor are connected to one switching transistor, and a plurality of data are outputted according to one address input. The ferroelectric memory device comprises a plurality of word lines for driving a corresponding memory cell in accordance with an input address; a plurality of bit lines crossing said word lines, respectively; a plurality of switching transistors connected both to the bit lines and the word lines, respectively; and a plurality of dielectric capacitors wherein one end is coupled in common to a node of the switching transistor, respectively; wherein a plurality of output data are outputted by selecting a memory cell including at least one switching transistor corresponding to the plurality of switching transistors, and to the plurality of dielectric capacitors.

Abstract: A synchronous semiconductor memory device having a plurality of external signal input buffer and a plurality of latch circuits, includes: a clock buffer for receiving an external clock signal to generate a buffered clock signal; a chip select buffer for receiving an external chip select signal and the buffered clock signal from said clock buffer to generate a buffered chip select signal, an inverted buffered chip select signal and a latch control signal, wherein the latch control signal is activated when the external clock signal is at the rising edge and the external chip select signal is low; a plurality of external signal buffers for receiving external signals to generate buffered signals and inverted buffered signals; and a plurality of latch circuits for latching and outputting the buffered signals and the inverted buffer signals to an internal logic circuit in response to the latch control signal.

Abstract: The present invention provides a reference voltage generating circuit for generating a stable reference voltage and having a long life time, and the reference voltage generating circuit for generating a reference voltage of a ferroelectric memory device having a plurality of bit line pairs, including: a first and second reference word line; a first dummy block comprising a plurality of switching transistors and a plurality of ferroelectric capacitors, wherein gates of the switching transistors are coupled to the first reference word line and drains/sources of the switching transistors are coupled to a bit line of one of the bit line pairs; a second dummy block comprising a plurality of switching transistors and a plurality of ferroelectric capacitors, wherein gates of the switching transistors are coupled to a second reference word line and drains/sources of the switching transistors are coupled to a bit bar line of one of the bit line pairs; and a reference plate line commonly coupled to the ferroelectric ca