Abstract: A silicon single crystal wafer is provided. The silicon single crystal wafer includes an IDP which is divided into an NiG region and an NIDP region, wherein the IDP region is a region where a Cu based defect is not detected, the NiG region is a region where an Ni based defect is detected and the NIPD region is a region where an Ni based defect is not detected.

Abstract: The present invention provides a system for guiding correction of walking gait and a control method thereof, which can make a user have fun in correction of walking gait so as to enhance a walking correction guiding effect. The control method of the system for guiding correction of walking gait includes the steps of: acquiring reference gait state information on the basis of user information; acquiring current gait state information on the basis of a gait signal received from a gait detecting device; composing a monitoring screen showing a comparison result between the reference gait state information and the current gait state information; and outputting the monitoring screen.

Abstract: A silicon single crystal wafer is provided. The silicon single crystal wafer includes an IDP which is divided into an NiG region and an NIDP region, wherein the IDP region is a region where a Cu based defect is not detected, the NiG region is a region where an Ni based defect is detected and the NIPD region is a region where an Ni based defect is not detected.

Abstract: A silicon single crystal wafer is provided. The silicon single crystal wafer includes an IDP which is divided into an NiG region and an NIDP region, wherein the IDP region is a region where a Cu based defect is not detected, the NiG region is a region where an Ni based defect is detected and the NIPD region is a region where an Ni based defect is not detected.

Abstract: A silicon single crystal wafer is provided. The silicon single crystal wafer includes an IDP which is divided into an NiG region and an NIDP region, wherein the IDP region is a region where a Cu based defect is not detected, the NiG region is a region where an Ni based defect is detected and the NIPD region is a region where an Ni based defect is not detected.

Abstract: Provided are a cell chip and a system thereof that are capable of detecting optimal conditions for stem cell differentiation by mechanical stimuli. The cell chip for cell differentiation experimentation includes a plurality of cell chambers for storing cells and culture media, cell and culture medium injection ports for transferring the cells and culture media to corresponding cell chambers, fine passages for moving the cells and the culture media injected into the cell and culture medium injection ports to the cell chambers, pneumatic injection ports for injecting pneumatic pressures applied to the cell chambers, and apertures having circular films for transferring the pneumatic pressures injected through the pneumatic injection ports to corresponding cell chambers. Here, at least two of the apertures may have different areas to vary the magnitude of pneumatic pressure applied to corresponding cell chambers.

Abstract: Provided are a cell chip and a system thereof that are capable of detecting optimal conditions for stem cell differentiation by mechanical stimuli. The cell chip for cell differentiation experimentation includes a plurality of cell chambers for storing cells and culture media, cell and culture medium injection ports for transferring the cells and culture media to corresponding cell chambers, fine passages for moving the cells and the culture media injected into the cell and culture medium injection ports to the cell chambers, pneumatic injection ports for injecting pneumatic pressures applied to the cell chambers, and apertures having circular films for transferring the pneumatic pressures injected through the pneumatic injection ports to corresponding cell chambers. Here, at least two of the apertures may have different areas to vary the magnitude of pneumatic pressure applied to corresponding cell chambers.