Patents by Inventor Woon-Chan Shin

Woon-Chan Shin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test carrier
    Patent number: 7629788
    Abstract: A test carrier includes an insert body, a first latch assembly including one or more first latches pivotally attached to the insert body, and a second latch assembly including one or more second latches pivotally attached to the insert body. The second latch assembly is configured to engage with an external connection terminal array of an electronic component during testing thereof. A method of testing a semiconductor device and a system for testing a semiconductor device are also provided.
    Type: Grant
    Filed: September 4, 2008
    Date of Patent: December 8, 2009
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong-Pil Park, Jong-Won Han, Woon-Chan Shin
  • TEST CARRIER
    Publication number: 20090140758
    Abstract: A test carrier includes an insert body, a first latch assembly including one or more first latches pivotally attached to the insert body, and a second latch assembly including one or more second latches pivotally attached to the insert body. The second latch assembly is configured to engage with an external connection terminal array of an electronic component during testing thereof. A method of testing a semiconductor device and a system for testing a semiconductor device are also provided.
    Type: Application
    Filed: September 4, 2008
    Publication date: June 4, 2009
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jong-Pil PARK, Jong-Won Han, Woon-Chan Shin
  • Method for cleaning socket using laser
    Publication number: 20070066122
    Abstract: A method for cleaning a socket used to test semiconductor packages using laser beam is provided. The method may include irradiating laser beam onto a socket have a plurality of contact pins to remove contaminated materials on the contact pins.
    Type: Application
    Filed: September 15, 2006
    Publication date: March 22, 2007
    Inventor: Woon-chan Shin