Patents by Inventor Woong-Hae CHOI

Woong-Hae CHOI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for automated testing of device under test
    Patent number: 8928341
    Abstract: An apparatus and a method for automated testing of electrostatic discharge of a Device Under Test (DUT) are provided. In the apparatus and the method, an electrostatic pulse is applied to the DUT, a malfunction type is detected from the DUT, and a control command is transmitted to the DUT to return a test mode of the DUT to a normal mode according to the detected malfunction type.
    Type: Grant
    Filed: January 9, 2013
    Date of Patent: January 6, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Han-Awl Lee, Jae-Kyu Lee, Woong-Hae Choi, Byoung-Hee Lee
  • APPARATUS AND METHOD FOR AUTOMATED TESTING OF DEVICE UNDER TEST
    Publication number: 20130328581
    Abstract: An apparatus and a method for automated testing of electrostatic discharge of a Device Under Test (DUT) are provided. In the apparatus and the method, an electrostatic pulse is applied to the DUT, a malfunction type is detected from the DUT, and a control command is transmitted to the DUT to return a test mode of the DUT to a normal mode according to the detected malfunction type.
    Type: Application
    Filed: January 9, 2013
    Publication date: December 12, 2013
    Applicant: SAMSUNG ELECTRONICS CO. LTD.
    Inventors: Han-Awl LEE, Jae-Kyu LEE, Woong-Hae CHOI, Byoung-Hee LEE